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TNETV2685FIDZUT7 数据表(PDF) 20 Page - Texas Instruments |
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TNETV2685FIDZUT7 数据表(HTML) 20 Page - Texas Instruments |
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20 / 191 page  TMS320DM647 TMS320DM648 SPRS372H – MAY 2007 – REVISED APRIL 2012 www.ti.com 2.6 Terminal Functions The terminal functions tables (Table 2-4 through Table 2-5) identify the external signal names, the associated pin (ball) numbers along with the mechanical package designator, the pin type, whether the pin has any internal pullup or pulldown resistors, and a functional pin description. For more detailed information on device configuration, peripheral selection, multiplexed/shared pin, and debugging considerations, see Section 3. All device boot and configuration pins are multiplexed with functional pins. These pins function as device boot and configuration pins only during device reset. When both the reset pin (RESET) and the power-on reset pin (POR) are deasserted, the input states of these multiplexed device boot and configuration pins are sampled and latched into the BOOTCFG register. For proper device operation, these pins must be pulled up/down to the desired value via an external resistor. Table 2-4. Terminal Functions TERMINAL NAME NO TYPE( INTERNAL OPER DESCRIPTION 1) PULLUP/ VOLT PULLDOWN Clock/PLL Configuration CLKIN1 M1 I IPD 3.3 V Clock Input for PLL1 CLKIN2 F1 I IPD 3.3 V Clock Input for PLL2 REFCLKN(2) AC11 I Differential Reference Clock input (negative) for SGMII REFCLKP(2) AB11 I Differential Reference Clock input (positive) for SGMII PLLV1 N3 A 1.8 V 1.8-V I/O Supply Voltage for PLL1 PLLV2 G7 A 1.8 V 1.8-V I/O Supply Voltage for PLL2 SYSCLK5 M3 I/O/Z IPD 3.3 V Clock out of device speed/4 JTAG TCLK H23 I IPU 3.3 V JTAG Test Port Clock TDI J22 I IPU 3.3 V JTAG Test Port Data In TDO J23 OZ IPU 3.3 V JTAG Test Port Data Out TMS L22 I IPU 3.3 V JTAG Test Port Mode Select TRST L23 I IPD 3.3 V JTAG Test Port Reset EMU0 K23 I/O/Z IPU 3.3 V JTAG Test Port Emulation 0 EMU1 K22 I/O/Z IPU 3.3 V JTAG Test Port Emulation 1 EMU2 K21 I/O/Z IPU 3.3 V JTAG Test Port Emulation 2 EMU3 K20 I/O/Z IPU 3.3 V JTAG Test Port Emulation 3 EMU4 L18 I/O/Z IPU 3.3 V JTAG Test Port Emulation 4 EMU5 J21 I/O/Z IPU 3.3 V JTAG Test Port Emulation 5 EMU6 K19 I/O/Z IPU 3.3 V JTAG Test Port Emulation 6 EMU7 H21 I/O/Z IPU 3.3 V JTAG Test Port Emulation 7 EMU8 J20 I/O/Z IPU 3.3 V JTAG Test Port Emulation 8 EMU9 H20 I/O/Z IPU 3.3 V JTAG Test Port Emulation 9 EMU10 J19 I/O/Z IPU 3.3 V JTAG Test Port Emulation 10 EMU11 K18 I/O/Z IPU 3.3 V JTAG Test Port Emulation 11 RESET/INTERRUPTS NMI J18 I IPD 3.3 V Nonmaskable Interrupt RESETSTAT H19 O 3.3 V Reset Status Pin RESET G20 I 3.3 V Device Reset POR H18 I 3.3 V Power On Reset (1) I = Input, O = Output, Z = High impedance, S = Supply voltage, GND = Ground, A = Analog signal (2) The clock input buffers on the REFCLKP/N pins are compatible with LVDS and LVPECL clock sources. These input buffers include a 100- Ω termination (P to N) and a common-mode biasing. Because the common-mode biasing is included, the clock source must be AC coupled. 20 Device Overview Copyright © 2007–2012, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Link(s): TMS320DM647 TMS320DM648 |
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