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TGA4548-SM-R 数据表(PDF) 7 Page - TriQuint Semiconductor |
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TGA4548-SM-R 数据表(HTML) 7 Page - TriQuint Semiconductor |
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7 / 12 page ![]() TGA4548-SM 17 – 20 GHz 10 W GaN Power Amplifier Data Sheet Rev. C, April 24, 2017 | Subject to change without notice 7 of 12 www.qorvo.com Thermal and Reliability Information Parameter Test Conditions Value Units Thermal Resistance (θJC) (1) CW Tbaseplate = +85 °C, VD = +28 V, ID = 300 mA, PDISS = 8.4 W 3.57 ºC/W Channel Temperature, TCH (IDQ) 115 °C Median Lifetime (TM) 5.7 x 1011 Hrs Thermal Resistance (θJC) (1) CW Tbaseplate = +85 °C, VD = +28 V, ID = 1050 mA, POUT = 40 dBm, PDISS = 19.4 W 3.61 ºC/W Channel Temperature, TCH (Under RF) 155 °C Median Lifetime (TM) 4.9 x 109 Hrs Notes: 1. Channel operating temperature will directly affect the device median lifetime (Tm). For maximum life, it is recommended that the channel temperatures be maintained at the lowest possible levels. Median Lifetime Test Conditions: VD = +28 V; Failure Criteria is 10% reduction in ID_MAX 1E+04 1E+05 1E+06 1E+07 1E+08 1E+09 1E+10 1E+11 1E+12 1E+13 1E+14 1E+15 75 100 125 150 175 200 225 250 275 Channel Temperature, TCH (°C) Median Lifetime vs. TCH FET16 |
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