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S29AS008J 数据表(PDF) 41 Page - Cypress Semiconductor |
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S29AS008J 数据表(HTML) 41 Page - Cypress Semiconductor |
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41 / 56 page ![]() Document Number: 002-00870 Rev.*K Page 41 of 56 S29AS008J 16. Test Conditions Figure 16.1 Test Setup 17. Key to Switching Waveforms Figure 17.1 Input Waveforms and Measurement Levels Test Specifications Test Condition 70 Unit Output Load Capacitance, CL (including jig capacitance) 100 pF Input Rise and Fall Times 3 ns Input Pulse Levels 0.0 – 2.0 V Input timing measurement reference levels 1.0 Output timing measurement reference levels 1.0 Waveform Inputs Outputs Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) CL Device Under Test Vcc 0.0 V Vcc/2 Output Measurement Level Input Vcc/2 |
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