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数据搜索系统，热门电子元器件搜索 |
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数据搜索系统，热门电子元器件搜索 |
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S29AS008J 数据表(PDF) 42 Page - Cypress Semiconductor |
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S29AS008J 数据表(HTML) 42 Page - Cypress Semiconductor |
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42 / 56 page  Document Number: 002-00870 Rev.*K Page 42 of 56 S29AS008J 18. AC Characteristics 18.1 Read Operations Notes 1. Not 100% tested. 2. See Figure 16.1 on page 41 and Table on page 41 for test specifications. Figure 18.1 Read Operations Timings Parameter Description Speed Options JEDEC Std Test Setup 70 Unit tAVAV tRC Read Cycle Time (Note 1) Min 70 ns tAVQV tACC Address to Output Delay CE# = VIL OE# = VIL Max 70 tELQV tCE Chip Enable to Output Delay OE# = VIL Max 70 tGLQV tOE Output Enable to Output Delay Max 25 tEHQZ tDF Chip Enable to Output High Z (Note 1) Max 25 tGHQZ tDF Output Enable to Output High Z (Note 1) Max 25 tOEH Output Enable Hold Time (Note 1) Read Min 0 Toggle and Data# Polling Min 10 tAXQX tOH Output Hold Time From Addresses, CE# or OE#, Whichever Occurs First (Note 1) Min 0 tCE Outputs WE# Addresses CE# OE# HIGH Z Output Valid HIGH Z Addresses Stable tRC tACC tOEH tOE 0 V RY/BY# RESET# tDF tSR/W tOH |
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