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AFT09MP055N 数据表(PDF) 2 Page - NXP Semiconductors |
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AFT09MP055N 数据表(HTML) 2 Page - NXP Semiconductors |
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2 / 21 page ![]() 2 RF Device Data Freescale Semiconductor, Inc. AFT09MP055NR1 AFT09MP055GNR1 Table 1. Maximum Ratings Rating Symbol Value Unit Drain--Source Voltage VDSS --0.5, +40 Vdc Gate--Source Voltage VGS --6.0, +12 Vdc Operating Voltage VDD 19, +0 Vdc Storage Temperature Range Tstg --65 to +150 °C Case Operating Temperature Range TC --40 to +150 °C Operating Junction Temperature Range (1,2) TJ --40 to +225 °C Total Device Dissipation @ TC =25°C Derate above 25°C PD 625 3.13 W W/°C Table 2. Thermal Characteristics Characteristic Symbol Value (2,3) Unit Thermal Resistance, Junction to Case Case Temperature 78°C, 55 W CW, 12.5 Vdc, IDQ(A+B) = 550 mA, 870 MHz RθJC 0.32 °C/W Table 3. ESD Protection Characteristics Test Methodology Class Human Body Model (per JESD22--A114) 2, passes 2500 V Machine Model (per EIA/JESD22--A115) A, passes 150 V Charge Device Model (per JESD22--C101) IV, passes 2000 V Table 4. Moisture Sensitivity Level Test Methodology Rating Package Peak Temperature Unit Per JESD22--A113, IPC/JEDEC J--STD--020 3 260 °C Table 5. Electrical Characteristics (TA =25°C unless otherwise noted) Characteristic Symbol Min Typ Max Unit Off Characteristics Zero Gate Voltage Drain Leakage Current (VDS =40 Vdc, VGS =0 Vdc) IDSS — — 3 μAdc Zero Gate Voltage Drain Leakage Current (VDS = 12.5 Vdc, VGS =0 Vdc) IDSS — — 2 μAdc Gate--Source Leakage Current (VGS =5 Vdc, VDS =0 Vdc) IGSS — — 1 μAdc On Characteristics Gate Threshold Voltage (VDS =10 Vdc, ID = 270 μAdc) VGS(th) 1.6 2.1 2.6 Vdc Drain--Source On--Voltage (VGS =10 Vdc, ID =2.85 Adc) VDS(on) — 0.14 — Vdc Forward Transconductance (4) (VGS =10 Vdc, ID =7.5 Adc) gfs — 7 — S 1. Continuous use at maximum temperature will affect MTTF. 2. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access MTTF calculators by product. 3. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes -- AN1955. 4. Each side of device measured separately. (continued) |
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