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FS501 数据表(PDF) 13 Page - Fortune Semiconductor Corp. |
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FS501 数据表(HTML) 13 Page - Fortune Semiconductor Corp. |
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13 / 31 page ![]() The interrupt procedures are as follows: (1) When new data appear in the enabled measure register, IRQO is cleared to 0 and kept in 0. (2) The microprocessor is activated by the negative edge of IRQO and then reads the contents of the interrupt status register. (3) After the read of interrupt status register, IRQO is set to 1. (4) Check IRQO. If it is not 1, the negative edge signal was not captured, and the microprocessor has to read the interrupt status register again. When reading the interrupt register, the negative edge of the new interrupt signal may be lost. Step (4) may improve this problem. The value of the interrupt status register whether is refreshed or not is independent of interrupt enable register. The interrupt enable register only affects the IRQO output. Measure Registers Table 5. Measure Register Address Name Content Register Length Read Times 0E SUM1<15:0> Output of low resolution high speed ADC 16 4 0F SUM1<23:0> Output of low speed high resolution ADC 24 6 The measure register and the corresponding address of FS501 are shown in Table 5. It is an output for reading of the microprocessor. The read timing sequence of the measure register is shown in Fig. 2. The negative edge of IRQC will clear INSTA<0>. The read count for each read should be correct. Otherwise, the high ALE will clear CYCNTR (read/write cycle counter) to 0. The read count of the measure register is shown in the last column of Table 5. When read the measure register, the low of RD_ should be longer than the sampling cycle of the ADC at the first read cycle. For other read cycles, the low of RD_ can be at least 2us. For example, the sampling rate of the ADC is 83.3kHz; then the first read cycle for reading the measure register should be greater than 12us. ALE RD_ CS_ Address 0F DATA<3:0> READ MEASURED REGISTER CYCLE DATA<N:N-3> 0 1 N/4 CYCNTR DATA<N-4:N-7> IRQC AD<3:0> 2 Fig. 2. The Read Timing Sequence of Measure Register |
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