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M28W320CT 数据表(PDF) 22 Page - STMicroelectronics |
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M28W320CT 数据表(HTML) 22 Page - STMicroelectronics |
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22 / 42 page ![]() M28W320CT, M28W320CB 22/42 Table 23. Read AC Characteristics (1) (TA = 0 to 70°C or –40 to 85°C) Note: 1. See AC Testing Measurement conditions for timi ng measurements. 2. Sampled only, not 100% tested. 3. G may be delayed by up to tELQV -tGLQV after the falling edge of E without increasing tELQV. 4. The device Reset is possible but not guaranteed if tPLPH < 100ns. Symbol Alt Parameter M28W320C Unit 90 100 VDD = 2.7V to 3.6V VDDQ = 2.7V min VDD = 2.7V to 3.6V VDDQ = 1.65V min Min Max Min Max tAVAV tRC Address Valid to Next Address Valid 90 100 ns tAVQV tACC Address Valid to Output Valid 90 100 ns tAXQX (2) tOH Address Transition to Output Transition 0 0 ns tEHQX (2) tOH Chip Enable High to Output Transition 0 0 ns tEHQZ (2) tHZ Chip Enable High to Output Hi-Z 25 30 ns tELQV (3) tCE Chip Enable Low to Output Valid 90 100 ns tELQX (2) tLZ Chip Enable Low to Output Transition 0 0 ns tGHQX (2) tOH Output Enable High to Output Transition 0 0 ns tGHQZ (2) tDF Output Enable High to Output Hi-Z 25 30 ns tGLQV (3) tOE Output Enable Low to Output Valid 30 35 ns tGLQX (2) tOLZ Output Enable Low to Output Transition 0 0 ns tPHQV tPWH Reset High to Output Valid 150 150 ns tPLPH (2,4) tRP Reset Pulse Width 100 100 ns |
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