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ADL5385ACPZ-R2 数据表(PDF) 21 Page - Analog Devices |
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ADL5385ACPZ-R2 数据表(HTML) 21 Page - Analog Devices |
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21 / 24 page ![]() ADL5385 Rev. 0 | Page 21 of 24 CHARACTERIZATION SETUP SSB SETUP Figure 43 is a diagram of the characterization test stand setup for the ADL5385, which is intended to test the product as a single-sideband modulator. The Aeroflex IFR3416 signal generator provides the I and Q inputs as well as the LO input. Output signals are measured directly using the spectrum analyzer, and currents and voltages are measured using the Agilent 34401A multimeter. RLM TEST RACK 1 AEROFLEX IFR 3416 250kHz TO 6GHz SIGNAL GENERATOR RF OUT VPOS +5V LO OUTPUT R&S SPECTRUM ANALYZER FSU 20Hz TO 8GHz CONNECT TO BACK OF UNIT RF IN AGILENT 34401A MULTIMETER – AGILENT E3631A POWER SUPPLY 6V + – ±25V COM + 5.0000 0.210A 0.210 ADC 90 DEG 0 DEG I Q DELL J4(QP) J5(IN) J6(IP) J7(LO) J1(OUT) VPOS J3(QN) GND ADL5385 50MHz TO 2GHz +6dBm FREQ 100MHz TO 4GHz LEVEL 0dBm BIAS 0.5V BIAS 0.5V GAIN 0.7V GAIN 0.7V Figure 43. ADL5385 Characterization Board SSB Test Setup |
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