RTQ2134-QA

Copyright © 2022 Richtek Technology Corporation. All rights reserved.

is a registered trademark of Richtek Technology Corporation.

DSQ2134-QA-02

May

2022

www.richtek.com

13

Parameter

Symbol

Test Conditions

Min

Typ

Max

Unit

Error Rate of DVS Slew

Rate

VIN = 3.7V, VOUT = 0.6V to 1.2V

−20

--

20

%

Digital Output Pin : INT

Output low level, ISOURCE = 2mA

--

--

0.4

V

Push-pull, ISINK = 2mA

1.6

--

VIO

V

Digital Output Pin : SDA

Output low level Resistor

--

--

40



I2C Speed

--

--

3.4

MHz

Hold Time (Repeated) Start

Condition. After this Period,

the First Clock Pulse is

Generated

tHD;STA

Fast mode

(Note5)

0.6

--

--

s

Low Period of the SCL

Clock

tLOW

Fast mode

(Note5)

1.3

--

--

s

High Period of the SCL

Clock

tHIGH

Fast mode

(Note5)

0.6

--

--

s

Set-Up Time for a Repeated

START Condition

tSU;STA

Fast mode

(Note5)

0.6

--

--

s

Data Hold Time

tHD;DAT

Fast mode

(Note5)

0

--

0.9

s

Data Set-Up Time

tSU;DAT

Fast mode

(Note5)

100

--

--

ns

Set-Up Time for STOP

Condition

tSU;STO

Fast mode

(Note5)

0.6

--

--

s

Bus Free Time between a

STOP and START

Condition

tBUF

Fast mode

(Note5)

1.3

--

--

s

Rising Time of both SDA

and SCL Signals

tR

Fast mode

(Note5)

20

--

300

ns

Falling Time of both SDA

and SCL Signals

tF

Fast mode

(Note5)

20

--

300

ns

SDA Output Low Sink

Current

IOL

SDA Voltage = 0.4V

(Note5)

2

--

--

mA

Detect SDA Low Timeout

tTIMEOUT

Fast/High speed mode

(Note5)

--

30

--

ms

Note 1. Stresses beyond those liste

d under “Absolute Maximum Ratings” may cause permanent damage to the device. These

are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in

the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions may affect

device reliability.

Note 2.

θJA is measured in the natural convection at TA = 25°C on a Four-layer Richtek Evaluation Board. θJC is measured at

the top of the package.

Note 3. Devices are ESD sensitive. Handling precautions are recommended.

Note 4. The device is not guaranteed to function outside its operating conditions.

Note 5. Guaranteed by design.