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CC2550-RTR1 数据表(PDF) 46 Page - Texas Instruments |
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CC2550-RTR1 数据表(HTML) 46 Page - Texas Instruments |
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46 / 55 page ![]() CC2550 PRELIMINARY Data Sheet (Rev.1.2) SWRS039A Page 46 of 54 0x2A: PTEST – Production test Bit Field Name Reset R/W Description 7 PTEST[7:0] 127 (0x7F) R/W Writing 0xBF to this register makes the on-chip temperature sensor available in the IDLE state. The default 0x7F value should then be written back before leaving the IDLE state. Other use of this register is for test only. 0x2C: TEST2 – Various test settings Bit Field Name Reset R/W Description 7:0 TEST2[7:0] 152 (0x98) R/W The value to use in this register is given by the SmartRF® Studio software. 0x2D: TEST1 – Various test settings Bit Field Name Reset R/W Description 7:0 TEST1[7:0] 49 (0x31) R/W The value to use in this register is given by the SmartRF® Studio software. 0x2E: TEST0 – Various test settings Bit Field Name Reset R/W Description 7:0 TEST0[7:0] 11 (0x0B) R/W The value to use in this register is given by the SmartRF® Studio software. 27.2 Status register details 0x30 (0xF0): PARTNUM – Chip ID Bit Field Name Reset R/W Description 7:0 PARTNUM[7:0] 130 (0x82) R Chip part number 0x31 (0xF1): VERSION – Chip ID Bit Field Name Reset R/W Description 7:0 VERSION[7:0] 2 (0x02) R Chip version number. |
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