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AM29PL160CB-65REF 数据表(PDF) 30 Page - Advanced Micro Devices |
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AM29PL160CB-65REF 数据表(HTML) 30 Page - Advanced Micro Devices |
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30 / 44 page ![]() 28 Am29PL160C 22143C7 May 9, 2006 D A TA SH EE T TEST CONDITIONS Table 12. Test Specifications KEY TO SWITCHING WAVEFORMS 2.7 k Ω CL 6.2 k Ω 3.3 V Device Under Test Figure 9. Test Setup Note: Diodes are IN3064 or equivalent Test Condition -65R -70R, -90 Unit Output Load 1 TTL gate Output Load Capacitance, CL (including jig capacitance) 30 100 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0–3.0 V Input timing measurement reference levels 1.5 V Output timing measurement reference levels 1.5 V WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) 3.0 V 0.0 V 1.5 V 1.5 V Output Measurement Level Input Figure 10. Input Waveforms and Measurement Levels |
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