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AM29PDS322D 数据表(PDF) 36 Page - Advanced Micro Devices |
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AM29PDS322D 数据表(HTML) 36 Page - Advanced Micro Devices |
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36 / 51 page ![]() 34 Am29PDS322D 23569A5 December 4, 2006 D A TA SH EE T TEST CONDITIONS Table 12. Test Specifications KEY TO SWITCHING WAVEFORMS CL Device Under Test Note: Diodes are IN3064 or equivalent Figure 13. Test Setup Test Condition 10 12 Unit Output Load Capacitance, C L (including jig capacitance) 30 100 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0–2.0 V V Input timing measurement reference levels 1.0 V Output timing measurement reference levels 1.0 V KS000010-PAL WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) VCC 0.0 V 1.0 V Output Measurement Level Input 0.5 VCC Figure 14. Input Waveforms and Measurement Levels |
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