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PCF8548U/2 数据表(PDF) 23 Page - NXP Semiconductors |
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PCF8548U/2 数据表(HTML) 23 Page - NXP Semiconductors |
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23 / 40 page ![]() 1999 Aug 16 23 Philips Semiconductors Product specification 65 × 102 pixels matrix LCD driver PCF8548 Notes 1. The maximum possible VLCD voltage that can be generated is dependent on voltage, temperature and (display) load. 2. Internal clock. 3. When fsclk = 0 there is no I2C-bus clock. 4. Power-down mode. During power-down all static currents are switched off. 5. If external VLCD, the display load current is not transmitted to IDD. 6. Tolerance depends on the temperature; (typically zero at Tamb =27 °C), maximum tolerance values are measured at the temperature range limit. 7. For TC0 to TC3. IDD(tot) total supply current with internal VLCD generation; VDD1 = 2.8 V; VLCD = 7.6 V; fsclk = 0; Tamb =25 °C; no display load; 4 × charge pump; notes 2 and 3 − 200 350 µA (Power-down mode) with internal or external VLCD generation; note 4 − 1.5 10 µA ILCDIN supply current from external VLCD VDD1 = 2.8 V; VLCD = 7.6 V; fsclk = 0; Tamb =25 °C; no display load; notes 2, 3 and 5 − 30 −µA Logic VIL LOW-level input voltage VSS1 − 0.3VDD1 V VIH HIGH-level input voltage 0.7VDD1 − VDD1 V IL leakage current Vi =VDD1 or VSS1 −1 − +1 µA Column and row outputs Rrow row output resistance R0 to R64 VDD1 to VDD3 = 5.0 V; VLCD = 7.6 V; IL =10 µA; outputs tested one at a time − 12 20 k Ω Rcol column output resistance C0 to C101 VLCD = 7.6 V − 12 20 k Ω Vbias(col) column bias tolerance C0 to C101 −100 0 +100 mV Vbias(row) row bias tolerance R0 to R64 −100 0 +100 mV LCD supply voltage generator VLCD VLCD tolerance internally generated VDD1 = 2.8 V; VLCD = 7.6 V; fsclk = 0; Tamb =25 °C; no display load; notes 2, 3 6 and 7 −300 0 +300 mV TC temperature coefficient 00 −−0.0 × 10−3 − 1/ °C 01 −−0.76 × 10−3 − 1/ °C 10 −−1.05 × 10−3 − 1/ °C 11 −−2.10 × 10−3 − 1/ °C SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT |
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