IRGPF30F datasheet(29/35 Pages) IRF

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ACCELERATEDMOISTURE RESISTANCE (A/C)Unbiased

Conditions

Temperature:

121°C

Pressure:

15Ibs psig

Bias:

None

Duration:

96 Hours nominal

Test points:

96 Hours

Purpose

Failure Modes

Sensitive Parameters

V(BR)CES, VCE(on)

Accelerated Moisture Resistance test is performed to evaluate the moisture resistance

of non-hermetic packages. Severe conditions of pressure, humidity and temperature

are applied that accelerate the penetration of moisture through the interface of the

encapsulant and the conductors that pass through it.

There are two failure modes which have been observed. The first mode, degradation

of the breakdown characteristics of the devices, can occur.

The second failure mode that has been observed is due to cathodic corrosion of

aluminum emitter bonding pad. Water will ingress to the top of the die. It is possible

for contaminants to work their way into the active area of the device while under

pressure in the presence of water. For that reason, the devices and test board are

cleaned prior to use. Then, throughout the course of the testing, the parts and the test

boards are never brought into contact with human contaminant.

IGBT / CoPack

Quarterly Reliability Report

Page 29 of 35

IRGPF30F 数据表(PDF) 29 Page - International Rectifier