IRGPF30F datasheet(6/35 Pages) IRF

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Using IGBT Reliability Information

Classic Bathtub Curve for failure rate of solid state devices

λ ( t )

Infant

Failures

Wearout

Failures

Random Failures

Log Time

Reliability is the probability that a semiconductor device will perform its

specified function in a given environment for a specified period of time.

Reliability is quality over time & environmental conditions.

Reliability can be defined as a probability of failure-free performance of a

required function, under a specified environment, for a given period of time.

The reliability of semiconductors has been extensively studied and the data

generated from these works is widely used in industry to estimate the

probabilities of system lifetimes. The reliability of a specific semiconductor

device is unique to the technology process used in fabrication and to the

external stress applied to the device.

In order to understand the reliability of specific product like the IGBT it is

useful to determine the failure rate associated with each environmental stress

that IGBT's encounter.

The values reported in this report are at a 60% upper confidence limit and the

equivalent device hours at state of working temperature of 90°C. It has been

shown that the failure rate of semiconductors in general. when followed for a

long period of time, exhibits what has been called a "Bathtub Curve" when

plotted against time for a given set of environmental conditions.

IGBT / CoPack

Quarterly Reliability Report

Page 6 of 35

IRGPF30F 数据表(PDF) 6 Page - International Rectifier