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CB45000 数据表(PDF) 6 Page - STMicroelectronics |
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CB45000 数据表(HTML) 6 Page - STMicroelectronics |
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6 / 16 page ![]() CB45000 SERIES 6/16 ® important as the packaging options become ever broader. The pad size and pitch are not determined until the customers choice of packaging, signal interface standards and I/O count is considered. Wire bond pad spacings down to 65 µ and 50µ centres will released in the near future to support large signal counts without die area loss. All pads except the sixteen corner pads can be configured as power or I/O pads. The configured power pads are known as placeable pads and have an associated current handling capability. Their placement is dependent on the types of output buffers used in the design. For rules governing the placement of pads, please contact your local SGS-THOMSON design centre. I/O TEST INTERFACE The IO cells have a dedicated test interface to facilitate parametric and Iddq testing of devices. This test interface connects standard core signals or dedicated test signals to the IO cells allowing all Output Buffers to be driven high, low or put into tristate regardless of the state of the internal logic. This greatly simplifies parametric testing of the part and also assisting customers who wish to use this feature during board testing. Note that all output buffers can be tristated by this function including buffers that normally do not tristate. This test function also turns off all pull up or down devices and shuts down all differential receivers and converts them into standard CMOS receivers. This allows Iddq test methodologies to be employed in a very efficient way, avoiding unneeded circuit overhead. Inside the IO cell is a section of specialized transistors used to create the receiver functions. A full set of standard receivers with pull up and pull down devices is present in the library. The technologies supported match the output buffer capabilities and include, LVCMOS, LVTTL, GTL, CTL, Differential, etc. and a five volt interface capability. MACROCELLS AND MACROFUNCTIONS The CB45000 series has internal macrocells that are robust in variety and performance. The cell selection has been driven by the need of Synthesis and HDL based design techniques. This offering is rich in buffers, complex combinatorial cells and multi power drive cells, which allow the Synthesis tool to create a netlist compatible with the requirements of Place and Route tools. Macrofunctions are a series of soft-macros facilitating quick capture of large functional blocks and are available for such functions as counters, shift register and adders. Macrofunctions are implemented at layout by utilizing macrocells and interconnecting to create the logic function. Table 3 I/O Drive Capacity for LVCMOS and LVTTL Slew Rate Buffers Current Drive (mA) Maximum Capacitance (pF) 2.0 50 4.0 100 8.0 200 12.0 300 16.0 400 Table 4 I/O Drive Capacity for LVCMOS and LVTTL Non Slew Rate Buffers Current Drive (mA) Maximum Capacitance (pF) 2.0 50 4.0 100 8.0 200 12.0 300 16.0 400 |
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