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STTH4R02SY 数据表(PDF) 4 Page - STMicroelectronics |
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STTH4R02SY 数据表(HTML) 4 Page - STMicroelectronics |
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4 / 14 page ![]() Characteristics STTH4R02-Y 4/14 DocID17391 Rev 2 Figure 5: Relative variation of thermal impedance, junction to ambient, versus pulse duration (SMB) Figure 6: Relative variation of thermal impedance, junction to ambient, versus pulse duration (SMC) Figure 7: Junction capacitance versus reverse applied voltage (typical values) Figure 8: Reverse recovery charges versus dlF/dt (typical values) Figure 9: Reverse recovery time versus dlF/dt (typical values) Figure 10: Peak reverse recovery current versus dlF/dt (typical values) 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.E-01 1.E+00 1.E+01 1.E+02 1.E+03 Zth(j-a)/Rth(j-a) t P (s) SMB SCU = 1 cm² 0.0 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.E-01 1.E+00 1.E+01 1.E+02 1.E+03 0.1 Zth(j-a)/Rth(j-a) tP(s) SMC S CU = 1 cm² 10 100 1 10 100 1000 C(pF) V R (V) F = 1 MHz V OSC = 30 mV RMS T j = 25 °C 0 20 40 60 80 100 120 0 50 100 150 200 250 300 350 400 450 500 Q RR (nC) T j = 125 °C dl F /dt (A/µs) T j = 25 °C I F = 4 A VR= 160 V 0 10 20 30 40 50 60 70 80 10 100 1000 tRR(ns) T j = 125 °C dlF/dt (A/µs) T j = 25 °C I F = 4 A V R = 160 V 0 2 4 6 8 10 0 50 100 150 200 250 300 350 400 450 500 IRM(A) T j = 125 °C dlF/dt (A/µs) T j = 25 °C I F = 4 A V R = 160 V |
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