NRF51822-CFAB-R datasheet(40/130 Pages) NORDIC

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nRF51822 Product Specification v3.3

Electrical specifications

This chapter contains electrical specifications for device interfaces and peripherals including radio

parameters and current consumption.

The test levels referenced are defined in Table 21.

Table 21 Test level definitions

8.1

Clock sources

8.1.1

16/32 MHz crystal startup

Figure 9 Current drawn at oscillator startup

Figure 9 shows the current drawn by the crystal oscillator (XOSC) at startup. The tSTART,XOSC period is the

time needed for the oscillator to start clocking. The length of tSTART,XOSC is dependent on the crystal

specifications.

The period following tSTART,XOSC to the end of tSTART,X16M /tSTART,X32M is fixed. This is the debounce period

where the clock stabilizes before it is made available to rest of the system.

Test level

Description

Simulated, calculated, by design (specification limit) or prototype samples

tested at NOC.

Parameters have been verified at Test level 1 and in addition:

Prototype samples tested at EOC.

Parameters have been verified at Test level 2 and in addition:

Production samples tested at EOC in accordance with JEDEC47.

Parameters have been verified at Test level 3 and in addition:

Production devices are limit tested at NOC.

tSTART,XOSC

tSTART,X16M / tSTART,X32M

ISTART,XOSC

NRF51822-CFAB-R 数据表(PDF) 40 Page - Nordic Semiconductor