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APM32F103TBU6-R 数据表(PDF) 54 Page - Geehy Semiconductor Co., Ltd. |
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APM32F103TBU6-R 数据表(HTML) 54 Page - Geehy Semiconductor Co., Ltd. |
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54 / 78 page ![]() w w w. g e e h y. c o m P a g e 53 TS (cycle) tS( μs) Maximum RAIN (kΩ) 1.5 0.11 1.2 7.5 0.54 10 13.5 0.96 19 28.5 2.04 41 41.5 2.96 60 55.5 3.96 80 71.5 5.11 104 239.5 17.1 350 1. Guaranteed by design and not tested in production. Table43 ADC Accuracy (1) (2) Symbol Parameter Test conditions Typical value Maximum value (3) Unit ET Composite error fPCLK2=56MHz, fADC=14MHz,RAIN <10KΩ, VDDA=2.4~3.6V,TA=-40~105℃ Measurement is conducted after ADC calculation ±2.5 ±4.5 LSB EO Offset error ±1.0 ±2 EG Gain error ±2.0 ±3.5 ED Differential linear error ±1.5 ±3 EL Integral linear error ±2.5 ±4 1. DC accuracy value of ADC is measured after internal calibration. 2. The backward injection of current will significantly affect the ADC accuracy. It is recommended to add a Schottky diode (between the pin and the ground) on the standard analog pin that may generate backward injection of current. As long as the forward injection current is within the range of IINJ (PIN) and ΣIINJ (PIN) given in 5.9, the ADC accuracy will not be affected. 3. It is assessed value. 5.12.1.2 Test of Built-in Reference Voltage Characteristics Table44 Built-in Reference Voltage Characteristics Symbol Parameter Condition Minimum value Typical value Maximum value Unit |
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