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STR730FZ1T7 数据表(PDF) 44 Page - STMicroelectronics

部件名 STR730FZ1T7
功能描述  ARM7TDMI??32-bit MCU with Flash, 3x CAN, 4 UARTs, 20 timers, ADC, 12 comm. interfaces
PDF  52 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

STR730FZ1T7 数据表(HTML) 44 Page - STMicroelectronics

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Electrical parameters
STR73xFxx
44/52
1.
ADC accuracy vs. negative injection current: Injecting negative current on any of the standard (non-robust)
analog input pins should be avoided as this significantly reduces the accuracy of the conversion being
performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to standard
analog pins which may potentially inject negative current. The effect of negative injection current on robust
pins is specified in Section 4.3.5.
Any positive injection current within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in Section 4.3.5 does not
affect the ADC accuracy.
2.
Calibration is needed once after each power-up.
Figure 21. ADC accuracy characteristics
Figure 22. Typical application with ADC
Table 27.
ADC accuracy with fMCLK = 20 MHz, fADC=10 MHz, RAIN < 10 kΩ RAIN,
VDDA=5 V. This assumes that the ADC is calibrated
2)
Symbol
Parameter
Conditions
Typ
Max
Unit
|ET|
Total unadjusted error 1)
1.0
2.0
LSB
|EO|
Offset error 1)
0.15
1.0
|EG|
Gain error 1)
0.97
1.1
|ED|
Differential linearity error1)
0.7
1.0
|EL|
Integral linearity error 1)
0.76
1.5
EO
EG
1LSBIDEAL
1LSB
IDEAL
V
DDA
V
SSA
1024
-----------------------------------------
=
V
(1) Example of an actual transfer curve
(2) The ideal transfer curve
(3) End point correlation line
ET=Total Unadjusted Error: maximum deviation
between the actual and the ideal transfer curves.
EO=Offset Error: deviation between the first actual
transition and the first ideal one.
EG=Gain Error: deviation between the last ideal
transition and the last actual one.
ED=Differential Linearity Error: maximum deviation
between actual steps and the ideal one.
EL=Integral Linearity Error: maximum deviation
between any actual transition and the end point
correlation line.
1023
1022
1021
5
4
3
2
1
0
7
6
1
2
345
67
1021 1022 1023 1024
(1)
(2)
ET
ED
EL
(3)
VDDA
VSSA
AINx
STR73X
VDD
IL
±1
μA
VT
0.6V
VT
0.6V
CADC
3.5pF
VAIN
RAIN
10-Bit A/D
conversion
2.3k
Ω(max)
CAIN



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