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L5953 数据表(PDF) 22 Page - STMicroelectronics |
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L5953 数据表(HTML) 22 Page - STMicroelectronics |
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22 / 31 page ![]() Summary of the main operations L5953 22/31 5.7 Operation G ● Write operation disabled 1) WRDI instruction ( Table 8.) 5.8 Operation H ● Read the diagnostic register case 3: after an IRQ pin activation 1) RDIA instruction ( Figure 17.) 2) Diagnostic register output ( Figure 17.) The delay between the IRQ activation and operation F must be longer than 100 μs Figure 13. Write enable latch sequence Figure 14. Test mode diagnostic procedure start (after a write enable latch sequence) Figure 15. Read the diagnostic registerCase1: (after a test mode diagnostic procedure start) 00 01 02 03 04 HIGH IMPEDANCE 05 06 07 S C CPOL=0 CPHA=0 D Q D03AU1483 00 01 02 03 04 HIGH IMPEDANCE INSTRUCTION STATUS REGISTER 05 06 07 08 09 10 11 12 13 14 15 16 17 18 19 20 21 22 23 s15 s14 s13 s12 s11 s10 s9 s8 s7 s6 s5 s4 s3 s2 s1 s0 S C D Q D03AU1484 CPOL=0, CPHA=0 00 01 02 03 04 HIGH IMPEDANCE INSTRUCTION DIAGNOSTIC REGISTER OUT 05 06 07 08 09 10 11 12 13 14 15 d7 d6 d5 d4 d3 d2 d1 d0 S C D Q D03AU1485 CPOL=0, CPHA=0 |
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