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H8SX/1663 数据表(PDF) 911 Page - Renesas Technology Corp |
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H8SX/1663 数据表(HTML) 911 Page - Renesas Technology Corp |
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911 / 1158 page ![]() Section 18 A/D Converter Rev.1.00 Jun. 07, 2006 Page 859 of 1102 REJ09B0294-0100 18.4.3 Input Sampling and A/D Conversion Time The A/D converter has a built-in sample-and-hold circuit. The A/D converter samples the analog input when the A/D conversion start delay time (t D) passes after the ADST bit in ADCSR is set to 1, then starts A/D conversion. Figure 18.4 shows the A/D conversion timing. Table 18.3 indicates the A/D conversion time. As indicated in figure 18.4, the A/D conversion time (t CONV) includes tD and the input sampling time (t SPL). The length of tD varies depending on the timing of the write access to ADCSR. The total conversion time therefore varies within the ranges indicated in table 18.3. In scan mode, the values given in table 18.3 apply to the first conversion time. The values given in table 18.4 apply to the second and subsequent conversions. In either case, bits CKS1 and CKS0 in ADCR should be set so that the conversion time is within the ranges indicated by the A/D conversion characteristics. (1) (2) tD tSPL tCONV P φ Address Write signal Input sampling timing ADF [Legend] (1): ADCSR write cycle (2): ADCSR address tD: A/D conversion start delay time tSPL: Input sampling time tCONV: A/D conversion time Figure 18.4 A/D Conversion Timing |
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