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AT89C5115-RATUM 数据表(PDF) 98 Page - ATMEL Corporation |
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AT89C5115-RATUM 数据表(HTML) 98 Page - ATMEL Corporation |
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98 / 113 page ![]() 98 AT89C5115 4128G–8051–02/08 3. Under steady state (non-transient) conditions, IOL must be externally limited as follows: Maximum IOL per port pin: 10 mA Maximum IOL per 8-bit port: Ports 1, 2 and 3: 15 mA Maximum total IOL for all output pins: 71 mA If IOL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current greater than the listed test conditions. 4. Power-down ICC is measured with all output pins disconnected; XTAL2 NC.; RST = VSS (See Figure 47.). 5. Idle ICC is measured with all output pins disconnected; XTAL1 driven with TCLCH, TCHCL = 5 ns, VIL = VSS + 0.5V, VIH = VCC - 0.5V; XTAL2 N.C; RST = VSS (See Figure 46.). 6. Operating ICC is measured with all output pins disconnected; XTAL1 driven with TCLCH, TCHCL = 5 ns (See Figure 48.), VIL = VSS + 0.5V, VIH = VCC - 0.5V; XTAL2 N.C.; RST = VCC. ICC would be slightly higher if a crystal oscillator used (See Figure 45.). 7. ICC_FLASH_WRITE operating current while a Flash block write is on going. Figure 45. ICC Test Condition, Active Mode Figure 46. ICC Test Condition, Idle Mode VaVcc V CC I CC (NC) CLOCK SIGNAL V CC All other pins are disconnected. RST XTAL2 XTAL1 VSS VCC VAGND RST XTAL2 XTAL1 V CC I CC (NC) VaVcc V CC All other pins are disconnected. CLOCK SIGNAL VSS VAGND |
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