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数据搜索系统，热门电子元器件搜索 |
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数据搜索系统，热门电子元器件搜索 |
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AT89C5115-RATUM 数据表(PDF) 99 Page - ATMEL Corporation |
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AT89C5115-RATUM 数据表(HTML) 99 Page - ATMEL Corporation |
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99 / 113 page  99 AT89C5115 4128G–8051–02/08 Figure 47. ICC Test Condition, Power-down Mode Figure 48. Clock Signal Waveform for ICC Tests in Active and Idle Modes DC Parameters for A/D Converter Table 73. DC Parameters for AD Converter in Precision Conversion Notes: 1. Typicals are based on a limited number of samples and are not guaranteed. 2. With ADC enabled. VaVcc RST XTAL2 XTAL1 V SS VCC ICC (NC) VCC All other pins are disconnected. VAGND V CC-0.5V 0.45V 0.7V CC 0.2VCC-0.1 TCLCH TCHCL T CLCH = TCHCL = 5ns. Symbol Parameter Min Typ(1) Max Unit Test Conditions AVin Analog input voltage Vss- 0.2 Max Vref + 0.6 V VaVcc Analog supply voltage Vref Vcc Vcc + 10% V Rref(2) Resistance between Vref and Vss 12 16 24 KΩ Vref Reference voltage 2.40 3.00 V Rai Analog input Resistor 400 Ω During sampling Cai Analog input Capacitance 60 pF During sampling INL Integral non linearity 1 2 lsb DNL Differential non linearity 0.5 1 lsb OE Offset error -2 2 lsb |
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