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ADIS16133/PCBZ 数据表(PDF) 15 Page - Analog Devices

部件名 ADIS16133/PCBZ
功能描述  짹1200째/sec Precision Angular Rate Sensor
PDF  20 Pages
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网页  http://www.analog.com
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ADIS16133/PCBZ 数据表(HTML) 15 Page - Analog Devices

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ADIS16133
Rev. 0 | Page 15 of 20
Example I/O Configuration
For example, set GPIO_CTRL[7:0] = 0x02 (DIN = 0x9A02)
to set DIO1 as an input and DIO2 as an output. Next, set
GPIO_CTRL[15:8] = 0x02 (DIN = 0x9B02) to set DIO2 in a
high output state. Monitor DIO1 by reading GPIO_CTRL[15:8]
(DIN = 0x1B00) and masking off the upper seven bits.
Table 31. MSC_CTRL Bit Descriptions
Bits
Description (Default = 0x0006)
[15:12]
Not used
[11]
Memory test (cleared upon completion)
(1 = enabled, 0 = disabled)
[10]
Automatic self-test (cleared upon completion)
(1 = enabled, 0 = disabled)
[9]
Manual self-test
(1 = enabled, 0 = disabled)
[8]
Not used
[7]
Disable sensor compensation
(1 = disable compensation, 0 = enable compensation)
[6:3]
Not used
[2]
Data ready enable
(1 = enabled, 0 = disabled)
[1]
Data ready polarity
(1 = active high, 0 = active low)
[0]
Data ready line select
(1 = DIO2, 0 = DIO1)
Table 32. GPIO_CTRL Bit Descriptions
Bits
Description (Default = 0x0000)
[15:10]
Don’t care
[9]
General-Purpose I/O Line 2 (DIO2) data level
[8]
General-Purpose I/O Line 1 (DIO1) data level
[7:2]
Don’t care
[1]
General-Purpose I/O Line 2 (DIO2) direction control
(1 = output, 0 = input)
[0]
General-Purpose I/O Line 1 (DIO1) direction control
(1 = output, 0 = input)
SELF-TEST
The MSC_CTRL bits (see Table 31) provide a self-test function,
which helps verify the mechanical integrity of the MEMS and
signal processing circuit. When enabled, the self-test applies an
electrostatic force to the internal sensor element, which causes it
to move in a manner that simulates its response to actual rotation.
Set MSC_CTRL[10] = 1 (DIN = 0x9D04) to run the self-test
routine, which reports a pass/fail result in DIAG_STAT[5].
MSC_CTRL[10] resets itself to 0 after completing this routine.
This process takes approximately 46 ms.
POWER MANAGEMENT
The SLP_CTRL register (see Table 33) provides two different
sleep modes for system level management: normal and timed.
Set SLP_CTRL[7:0] = 0xFF (DIN = 0xA4FF) to start normal
sleep mode. To awaken the device from sleep mode, use one of
the following options to restore normal operation: assert CS
from high to low, pulse RST low and then high again, or cycle
the power. Use SLP_CTRL[7:0] to put the device into sleep
mode for a specified period. For example, SLP_CTRL[7:0] =
0x64 (DIN = 0xA464) puts the ADIS16133 to sleep for 50 sec.
Table 33. SLP_CTRL Bit Descriptions
Bits
Description
[15:8]
Not used
[7:0]
0xFF: normal sleep mode
0x00 to 0xFE: programmable sleep time bits; 0.5 sec/LSB
STATUS
The DIAG_STAT register (see Table 34) provides error flags for
a number of functions. Each flag uses a 1 to indicate an error con-
dition and a 0 to indicate a normal condition. Reading this register
provides access to the status of each flag and resets all of the bits
to 0 for monitoring future operation. If the error condition remains,
the error flag returns to 1 at the conclusion of the next sample
cycle. DIAG_STAT[0] does not require a read of this register to
return to 0. If the power supply voltage returns to within range,
this flag clears automatically. The SPI communication error flag
in DIAG_STAT[3] indicates that the number of SCLKs in a SPI
sequence did not equal a multiple of 16 SCLKs.
Table 34. DIAG_STAT Bit Descriptions
Bits
Description (Default = 0x0000)
[15:10]
Not used
[9]
Alarm 2 status (1 = active, 0 = inactive)
[8]
Alarm 1 status (1 = active, 0 = inactive)
[7]
Not used
[6]
Flash test, checksum flag (1 = fail, 0 = pass)
[5]
Self-test diagnostic error flag (1 = fail, 0 = pass)
[4]
Sensor overrange (1 = overrange, 0 = normal)
[3]
SPI communication failure (1 = fail, 0 = pass)
[2]
Flash update failure (1 = fail, 0 = pass)
[1]
Not used
[0]
Power supply low, (1 = VCC < 4.75 V, 0 = VCC ≥ 4.75 V)



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