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ADIS16133/PCBZ 数据表(PDF) 15 Page - Analog Devices |
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ADIS16133/PCBZ 数据表(HTML) 15 Page - Analog Devices |
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15 / 20 page ![]() ADIS16133 Rev. 0 | Page 15 of 20 Example I/O Configuration For example, set GPIO_CTRL[7:0] = 0x02 (DIN = 0x9A02) to set DIO1 as an input and DIO2 as an output. Next, set GPIO_CTRL[15:8] = 0x02 (DIN = 0x9B02) to set DIO2 in a high output state. Monitor DIO1 by reading GPIO_CTRL[15:8] (DIN = 0x1B00) and masking off the upper seven bits. Table 31. MSC_CTRL Bit Descriptions Bits Description (Default = 0x0006) [15:12] Not used [11] Memory test (cleared upon completion) (1 = enabled, 0 = disabled) [10] Automatic self-test (cleared upon completion) (1 = enabled, 0 = disabled) [9] Manual self-test (1 = enabled, 0 = disabled) [8] Not used [7] Disable sensor compensation (1 = disable compensation, 0 = enable compensation) [6:3] Not used [2] Data ready enable (1 = enabled, 0 = disabled) [1] Data ready polarity (1 = active high, 0 = active low) [0] Data ready line select (1 = DIO2, 0 = DIO1) Table 32. GPIO_CTRL Bit Descriptions Bits Description (Default = 0x0000) [15:10] Don’t care [9] General-Purpose I/O Line 2 (DIO2) data level [8] General-Purpose I/O Line 1 (DIO1) data level [7:2] Don’t care [1] General-Purpose I/O Line 2 (DIO2) direction control (1 = output, 0 = input) [0] General-Purpose I/O Line 1 (DIO1) direction control (1 = output, 0 = input) SELF-TEST The MSC_CTRL bits (see Table 31) provide a self-test function, which helps verify the mechanical integrity of the MEMS and signal processing circuit. When enabled, the self-test applies an electrostatic force to the internal sensor element, which causes it to move in a manner that simulates its response to actual rotation. Set MSC_CTRL[10] = 1 (DIN = 0x9D04) to run the self-test routine, which reports a pass/fail result in DIAG_STAT[5]. MSC_CTRL[10] resets itself to 0 after completing this routine. This process takes approximately 46 ms. POWER MANAGEMENT The SLP_CTRL register (see Table 33) provides two different sleep modes for system level management: normal and timed. Set SLP_CTRL[7:0] = 0xFF (DIN = 0xA4FF) to start normal sleep mode. To awaken the device from sleep mode, use one of the following options to restore normal operation: assert CS from high to low, pulse RST low and then high again, or cycle the power. Use SLP_CTRL[7:0] to put the device into sleep mode for a specified period. For example, SLP_CTRL[7:0] = 0x64 (DIN = 0xA464) puts the ADIS16133 to sleep for 50 sec. Table 33. SLP_CTRL Bit Descriptions Bits Description [15:8] Not used [7:0] 0xFF: normal sleep mode 0x00 to 0xFE: programmable sleep time bits; 0.5 sec/LSB STATUS The DIAG_STAT register (see Table 34) provides error flags for a number of functions. Each flag uses a 1 to indicate an error con- dition and a 0 to indicate a normal condition. Reading this register provides access to the status of each flag and resets all of the bits to 0 for monitoring future operation. If the error condition remains, the error flag returns to 1 at the conclusion of the next sample cycle. DIAG_STAT[0] does not require a read of this register to return to 0. If the power supply voltage returns to within range, this flag clears automatically. The SPI communication error flag in DIAG_STAT[3] indicates that the number of SCLKs in a SPI sequence did not equal a multiple of 16 SCLKs. Table 34. DIAG_STAT Bit Descriptions Bits Description (Default = 0x0000) [15:10] Not used [9] Alarm 2 status (1 = active, 0 = inactive) [8] Alarm 1 status (1 = active, 0 = inactive) [7] Not used [6] Flash test, checksum flag (1 = fail, 0 = pass) [5] Self-test diagnostic error flag (1 = fail, 0 = pass) [4] Sensor overrange (1 = overrange, 0 = normal) [3] SPI communication failure (1 = fail, 0 = pass) [2] Flash update failure (1 = fail, 0 = pass) [1] Not used [0] Power supply low, (1 = VCC < 4.75 V, 0 = VCC ≥ 4.75 V) |
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