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325 数据表(PDF) 29 Page - Intel Corporation |
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325 数据表(HTML) 29 Page - Intel Corporation |
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29 / 82 page  Datasheet 29 Electrical Specifications NOTES: 1. VOS is measured overshoot voltage. 2. TOS is measured time duration above VID. 2.12.1 Die Voltage Validation Overshoot events from application testing on real processors must meet the specifications in Table 2-17 when measured across the VCC_SENSE and VSS_SENSE pins. Overshoot events that are < 10 ns in duration may be ignored. These measurements of processor die level overshoot should be taken with a 100 MHz bandwidth limited oscilloscope. Figure 2-3. VCC Overshoot Example Waveform Time Example Overshoot Waveform VID VID + 0.050 T OS V OS T OS: Overshoot time above VID V OS: Overshoot above VID |
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