CC2500-RTR1 datasheet(81/96 Pages) TI

81 / 96 page

CC2500

SWRS040C

Page 81 of 89

0x2B: AGCTEST – AGC Test

Bit

Field Name

Reset

R/W

Description

7:0

AGCTEST[7:0]

(0x3F)

R/W

For test only. Do not write to this register.

0x2C: TEST2 – Various Test Settings

Bit

Field Name

Reset

R/W

Description

7:0

TEST2[7:0]

136 (0x88)

R/W

Set to 0x81 for improved sensitivity at data rates

≤100 kBaud. The

temperature range is then from 0

oC to +85oC.

0x2D: TEST1 – Various Test Settings

Bit

Field Name

Reset

R/W

Description

7:0

TEST1[7:0]

49 (0x31)

R/W

Set to 0x35 for improved sensitivity at data rates

≤100 kBaud. The

temperature range is then from 0

oC to +85oC.

0x2E: TEST0 – Various Test Settings

Bit

Field Name

Reset

R/W

Description

7:2

TEST0[7:2]

2 (0x02)

R/W

The value to use in this register is given by the SmartRF

 Studio

software [5].

VCO_SEL_CAL_EN

R/W

Enable VCO selection calibration stage when 1

TEST0[0]

R/W

The value to use in this register is given by the SmartRF

 Studio

software [5].

32.3

Status Register Details

0x30 (0xF0): PARTNUM – Chip ID

Bit

Field Name

Reset

R/W

Description

7:0

PARTNUM[7:0]

128 (0x80)

Chip part number

0x31 (0xF1): VERSION – Chip ID

Bit

Field Name

Reset

R/W

Description

7:0

VERSION[7:0]

3 (0x03)

Chip version number.

0x32 (0xF2): FREQEST – Frequency Offset Estimate from Demodulator

Bit

Field Name

Reset

R/W

Description

7:0

FREQOFF_EST

The estimated frequency offset (2’s complement) of the carrier.

Resolution is FXTAL/2

14 (1.59 - 1.65 kHz); range is ±202 kHz to

±210 kHz, dependent of XTAL frequency.

Frequency offset compensation is only supported for 2-FSK;

GFSK and MSK modulation. This register will read 0 when

using OOK modulation.

CC2500-RTR1 数据表(PDF) 81 Page - Texas Instruments

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CC2500-RTR1 数据表(PDF) 81 Page - Texas Instruments

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