Stand-Alone, 10-Channel, 10-Bit System Monitors

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5

TIMING CHARACTERISTICS

2, and 4)

PARAMETER

SYMBOL

CONDITIONS

MIN

TYP

MAX

UNITS

SCLK Clock Period

100

ns

SCLK Pulse Width High Time

45

ns

SCLK Pulse Width Low Time

45

ns

DIN to SCLK Setup Time

25

ns

DIN to SCLK Hold Time

0ns

CS Fall to SCLK Rise Setup

25

ns

SCLK Rise to CS Rise Hold

50

ns

SCLK Fall to DOUT Valid

50

ns

CS Rise to DOUT Disable

40

ns

CS Fall to DOUT Enable

40

ns

CS Pulse Width High

50

ns

Note 1:

Note 2:

Relative accuracy is the deviation of the analog value at any code from its theoretical value after the gain and offset errors

have been calibrated.

Note 3:

Offset nulled.

Note 4:

In reference mode 00, the reference system powers up for each temperature measurement. In reference mode 01, the ref-

erence system powers up once per sequence of channels scanned. If a sample wait <80µs is programmed, the reference

system is on all the time. In reference mode 10, the reference system is on all the time (see Table 7).

Note 5:

No external capacitor on REF.

Note 6:

The operational input voltage range for each individual input of a differentially configured pair (AIN0–AIN7) is from GND to

Note 7:

See Figure 3 and the Sampling Error vs. Input Source Impedance graph in the

Typical Operating Characteristics section.

Note 8:

Grade A tested at +10°C and +55°C. -20°C to +85°C and -40°C to +85°C specifications guaranteed by design. Grade B

Note 9:

External temperature measurement mode using an MMBT3904 (Diodes Inc.) as a sensor. External temperature sensing

from -40°C to +85°C; MAX1153/MAX1154 held at +25°C.

Note 10: Performing eight single-ended external channels’ temperature measurements, an internal temperature measurement, and

surement with no sample wait results in a conversion rate of 7ksps per channel.

surement with maximum sample wait results in a conversion rate of 3ksps per channel.

sured using external reference.