LSM303DLH datasheet(19/47 Pages) STMICROELECTRONICS

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LSM303DLH

Functionality

Doc ID 16941 Rev 1

19/47

By placing the mode register into single-conversion mode (0x01), two data acquisition

cycles are made on each magnetic vector.

The first acquisition is a set pulse followed shortly by measurement data of the external field.

The second acquisition has the offset strap excited in the positive bias mode to create about

a 0.6

gauss self-test field plus the external field. The first acquisition values are subtracted

from the second acquisition, and the net measurement is placed into the data output

registers.

To leave self-test mode, change the MS1 and MS0 bits of the configuration register A back

to 0x00. Also, change the mode register if single-conversion mode is not the intended next

mode of operation.

Table 7.

Magnetic ST (positive bias)

Symbol

GN bits setting

Test axis

Min.

Typ.(1)

Typical specifications are not guaranteed

Max.

Unit

ST_M

GN bits set to 001

X,Y axis

655

LSB

Z axis

630

GN bits set to 010

X,Y axis

495

Z axis

470

GN bits set to 011

X,Y axis

395

Z axis

375

GN bits set to 100

X,Y axis

270

Z axis

255

GN bits set to 101

X,Y axis

235

Z axis

225

GN bits set to 110

X,Y axis

200

Z axis

190

GN bits set to 111(2)

X,Y axis

140

Z axis

135

Obsolete

Product(s)

- Obsolete

Product(s)

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