Data Sheet

ADuCM360/ADuCM361

Rev. B | Page 9 of 24

Parameter

Test Conditions/Comments

Min

Typ

Max

Unit

Logic Outputs

IOVDD − 0.4

V

0.4

V

CRYSTAL OSCILLATOR1

32.768 kHz crystal inputs

Logic Inputs, XTALI Only14

0.8

V

1.7

V

XTALI Capacitance

6

pF

XTALO Capacitance

6

pF

ON-CHIP LOW POWER OSCILLATOR

Oscillator Frequency

32.768

kHz

Accuracy

−30

±10

+30

%

ON-CHIP HIGH FREQUENCY OSCILLATOR

Oscillator Frequency

16

MHz

Accuracy

−40°C to +125°C

−1.8

+1.4

%

Long Term Stability5

0.8

°C/1000Hr

PROCESSOR CLOCK RATE1

Nine programmable core clock

selections within specified range

0.0625

0.5

16

MHz

Using an External Clock

0.032768

16

MHz

PROCESSOR START-UP TIME1

At Power-On

Includes kernel power-on execution

time

41

ms

After Reset Event

Includes kernel power-on execution

time

1.44

ms

From Processor Power-Down

(Mode 1, Mode 2, and Mode 3)

3 to 5

From Total Halt or Hibernate Mode

(Mode 4 or Mode 5)

30.8

μs

POWER REQUIREMENTS

AVDD, IOVDD

1.8

3.6

V

Power Consumption

Processor clock rate = 16 MHz;

all peripherals on (CLKSYSDIV = 0)

5.5

mA

Processor clock rate = 8 MHz;

all peripherals on (CLKSYSDIV = 1)

3

mA

Processor clock rate = 500 kHz; both

ADCs on (input buffers off) with PGA

gain = 4, 1 × SPI port on, all timers on

1

mA

Full temperature range, total halt mode

(Mode 4)

4

μA

Reduced temperature range, −40°C

to +85°C

4

μA

PGA enabled, gain ≥ 32

320

μA

PGA

Gain = 4, 8, or 16, PGA only

130

μA

Gain = 32, 64, or 128, PGA only

180

μA

Input Buffers

2 × input buffers = 70 μA

70

μA

Digital Interface and Modulator

70

μA

Input buffers off, gain = 4, 8, or 16 only

200

μA

External Reference Input Buffers

60 μA each

120

μA

1

These numbers are not production tested, but are guaranteed by design and/or characterization data at production release.

2

Tested at gain = 4 after initial offset calibration.

3

Measured with an internal short. A system zero-scale calibration removes this error.

4

A recalibration at any temperature removes these errors.

5

The long term stability specification is noncumulative. The drift in subsequent 1000 hour periods is significantly lower than in the first 1000 hour period.

6

These numbers do not include internal reference temperature drift.

7

Factory calibrated at gain = 1.