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AD8351ARM-R2 数据表(PDF) 13 Page - Analog Devices |
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AD8351ARM-R2 数据表(HTML) 13 Page - Analog Devices |
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13 / 16 page ![]() REV. B AD8351 –13– It is important to ensure that all I/O, ground, and RG port traces be kept as short as possible. In addition, it is required that the ground plane be removed from under the package. Due to the inverse relationship between the gain of the device and the value of the RG resistor, any parasitic capacitance on the RG ports can result in gain-peaking at high frequencies. Following the precau- tions outlined in Figure 12 will help to reduce parasitic board capacitance, thus extending the device’s bandwidth and reducing potential peaking or oscillation. COPLANAR WAVEGUIDE OR STRIP 2 1 3 4 5 9 10 8 7 6 RT RIP RT RIP RG ROP ROP Hi-Z AGND AGND Figure 12. General Description of Recommended Board Layout for High-Z Load Conditions TRANSMISSION LINE EFFECTS As noted, stray transmission line capacitance, in combination with package parasitics, can potentially form a resonant circuit at high frequencies, resulting in excessive gain peaking. RF transmission lines connecting the input and output networks should be designed such that stray capacitance is minimized. The output single-ended source impedance of the AD8351 is dynamically set to a nominal value of 75 Ω. Therefore, for a matched load termination, the characteristic impedance of the output transmission lines should be designed to be 75 Ω. In many situations, the final load impedance may be relatively high, greater than 1 k Ω. It is suggested that the board be designed as shown in Figure 12 for high impedance load conditions. In most practical board designs, this requires that the printed-circuit board traces be dimensioned to a small width (~5 mils) and that the underlying and adjacent ground planes are far enough away to minimize capacitance. Typically the driving source impedance into the device will be low and terminating resistors will be used to prevent input reflec- tions. The transmission line should be designed to have the appropriate characteristic impedance in the low-Z region. The high impedance environment between the terminating resistors and device input pins should not have ground planes under- neath or near the signal traces. Small parasitic suppressing resistors may be necessary at the device input pins to help desensitize (“de-Q”) the resonant effects of the device bond wires and surrounding parasitic board capacitance. Typically, 25 Ω series resistors (size 0402) adequately de-Q the input system without a significant decrease in ac performance. Figure 13 illustrates the value of adding input and output series resistors to help desensitize the resonant effects of board parasitics. Overshoot and undershoot can be significantly reduced with the simple addition of RIP and ROP. TIME (ns) 04 –0.5 –1.5 0 –1.0 1.5 0.5 13 1.0 2 RIP = ROP = 25 NO RIP OR ROP ROP = 25 Figure 13. Step Response Characteristics with and without Input and Output Parasitic Suppression Resistors CHARACTERIZATION SETUP The test circuit used for 150 Ω and 1 kΩ load testing is provided in Figure 14. The evaluation board uses balun transformers to simplify interfacing to single-ended test equipment. Balun effects need to be removed from the measurements in order to accu- rately characterize the performance of the device at frequencies exceeding 1 GHz. The output L-pad matching networks provide a broadband impedance match with minimum insertion loss. The input lines are terminated with 50 Ω resistors for input impedance matching. The power loss associated with these networks needs to be accounted for when attempting to measure the gain of the device. The required resistor values and the appropriate inser- tion loss and correction factors used to assess the voltage gain are provided in Table II. Table II. Load Conditions Specified Differentially Conversion Total Factor Load Insertion 20 log (S21) Condition R1 R2 Loss to 20 log (AV) 150 Ω 43.2 Ω 86.6 Ω 5.8 dB 7.6 dB 1 k Ω 475 Ω 52.3 Ω 15.9 dB 25.9 dB BALANCED SOURCE RS 50 0.1nF 0.1nF 100nF RLOAD RS 50 RT 50 RT 50 50 CABLE 50 CABLE AD8351 DUT R1 100nF 50 CABLE 50 CABLE R1 R2 R2 50 50 50 TEST EQUIPMENT Figure 14. Test Circuit |
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