COMBOSMARTMETER datasheet(39/60 Pages) TI1

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ADS131E04

ADS131E06

ADS131E08

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SBAS561A – JUNE 2012 – REVISED APRIL 2013

CONFIG2: Configuration Register 2

Address = 02h

BIT 7

BIT 6

BIT 5

BIT 4

BIT 3

BIT 2

BIT 1

BIT 0

INT_TEST

TEST_AMP0

TEST_FREQ1

TEST_FREQ0

This register configures the test signal generation. See the Input Multiplexer section for more details.

Bits[7:5]

Must be set to '1'

Bit 4

INT_TEST: Test source

This bit determines the source for the Test signal.

0 = Test signals are driven externally (default)

1 = Test signals are generated internally

Bit 3

Must be set to '0'

Bit 2

TEST_AMP: Test signal amplitude

These bits determine the Calibration signal amplitude.

0 = 1 × –(VREFP – VREFN) / 2400 (default)

1 = 2 × –(VREFP – VREFN) / 2400

Bits[1:0]

TEST_FREQ[1:0]: Test signal frequency

These bits determine the calibration signal frequency.

00 = Pulsed at fCLK / 2

21 (default)

01 = Pulsed at fCLK / 2

10 = Not used

11 = At dc

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COMBOSMARTMETER 数据表(PDF) 39 Page - Texas Instruments

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