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COMBOSMARTMETER 数据表(PDF) 48 Page - Texas Instruments |
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COMBOSMARTMETER 数据表(HTML) 48 Page - Texas Instruments |
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48 / 60 page ![]() Device EMI Filter To ADC PGA 3-Bit DAC (1) COMP_TH[2:0] Fault Detect Control Register FAULT_STATP FAULT_STATN + - INP INN AVDD AVSS R R Voltage Or Current Sensing ADS131E04 ADS131E06 ADS131E08 SBAS561A – JUNE 2012 – REVISED APRIL 2013 www.ti.com FAULT DETECTION The ADS131E0x have integrated comparators that can be used in conjunction with the external pull-up or pull- down resistors (R) to detect various fault conditions. The basic principle is to compare the input voltage with the one set by the fault comparator 3-bit digital-to-analog converter (DAC), as shown in Figure 46. The comparator trigger threshold level is set by the COMP_TH[2:0] bits in the FAULT register. Assuming that the ADS131E0x is powered from ±2.5-V supply and COMP_TH[2:0] = 000 (95% and 5%), the high-side trigger threshold is set at +2.25 V [equal to AVSS + (AVDD + AVSS) × 95%] and the low-side threshold is set at –2.25 V [equal to AVSS + (AVDD + AVSS) × 5%]. The threshold calculation formula applies to unipolar as well as bipolar supplies. A fault condition, such as an input signal going out of a predetermined range, can be detected by setting the appropriate threshold level using the COMP_TH[2:0] bits. An open-circuit fault at the INP or INN pin can be detected by using the external pull-up and pull-down resistors, which rail the corresponding input when the input circuit breaks, causing the fault comparators to trip. To pinpoint which of the inputs is out of range, the status of the FAULT_STATP and FAULT_STATN registers can be read, which is available as part of the output data stream; see the Data Output (DOUT) subsection of the SPI Interface section. (1) The configurable 3-bit DAC is common to all channels. Figure 46. Fault Detect Comparators 48 Submit Documentation Feedback Copyright © 2012–2013, Texas Instruments Incorporated Product Folder Links: ADS131E04 ADS131E06 ADS131E08 |
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