STM32F217VG datasheet(94/173 Pages) STMICROELECTRONICS

94 / 173 page

Electrical characteristics

STM32F21xxx

94/173

Doc ID 17050 Rev 8

5.3.15

I/O current injection characteristics

As a general rule, current injection to the I/O pins, due to external voltage below VSS or

above VDD (for standard, 3 V-capable I/O pins) should be avoided during normal product

operation. However, in order to give an indication of the robustness of the microcontroller in

cases when abnormal injection accidentally happens, susceptibility tests are performed on a

sample basis during device characterization.

Functional susceptibilty to I/O current injection

While a simple application is executed on the device, the device is stressed by injecting

current into the I/O pins programmed in floating input mode. While current is injected into the

I/O pin, one at a time, the device is checked for functional failures.

The failure is indicated by an out of range parameter: ADC error above a certain limit (>5

LSB TUE), out of spec current injection on adjacent pins or other functional failure (for

example reset, oscillator frequency deviation).

The test results are given in Table 42.

Table 41.

Electrical sensitivities

Symbol

Parameter

Conditions

Class

Static latch-up class

TA = +105 °C conforming to JESD78A

II level A

Table 42.

I/O current injection susceptibility

Symbol

Description

Functional susceptibility

Unit

Negative

injection

Positive

injection

IINJ

Injected current on all FT pins

–5

Injected current on any other pin

–5

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