STM32F415RG datasheet(109/186 Pages) STMICROELECTRONICS

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STM32F415xx, STM32F417xx

Electrical characteristics

5.3.14

Absolute maximum ratings (electrical sensitivity)

Based on three different tests (ESD, LU) using specific measurement methods, the device is

stressed in order to determine its performance in terms of electrical sensitivity.

Electrostatic discharge (ESD)

Electrostatic discharges (a positive then a negative pulse separated by 1 second) are

applied to the pins of each sample according to each pin combination. The sample size

depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test

conforms to the JESD22-A114/C101 standard.

Static latchup

Two complementary static tests are required on six parts to assess the latchup

performance:

•

A supply overvoltage is applied to each power supply pin

•

A current injection is applied to each input, output and configurable I/O pin

These tests are compliant with EIA/JESD 78A IC latchup standard.

Table 43. EMI characteristics

Symbol

Parameter

Conditions

Monitored

frequency band

Max vs.

[fHSE/fCPU]

Unit

25/168 MHz

SEMI

Peak level

VDD = 3.3 V, TA = 25 °C, LQFP176

package, conforming to SAE J1752/3

EEMBC, code running from Flash with

ART accelerator enabled

0.1 to 30 MHz

dBµV

30 to 130 MHz

130 MHz to 1GHz

SAE EMI Level

VDD = 3.3 V, TA = 25 °C, LQFP176

package, conforming to SAE J1752/3

EEMBC, code running from Flash with

ART accelerator and PLL spread

spectrum enabled

0.1 to 30 MHz

dBµV

30 to 130 MHz

130 MHz to 1GHz

SAE EMI level

3.5

Table 44. ESD absolute maximum ratings

Symbol

Ratings

Conditions

Class

Maximum

value(1)

Unit

VESD(HBM)

Electrostatic discharge

voltage (human body

model)

TA = +25 °C conforming to JESD22-A114

2000(2)

VESD(CDM)

Electrostatic discharge

voltage (charge device

model)

TA = +25 °C conforming to JESD22-C101

500

1. Based on characterization results, not tested in production.

2. On VBAT pin, VESD(HBM) is limited to 1000 V.

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