AS8501 - Data Sheet

austriamicrosystems

Revision 1.1, 04-April-06

www.austriamicrosystems.com

Page 6 of 40

Electrical characteristics (continued)

VDDA=5V +/-0.1 V, fclk=8.192 MHz, chopping ratio MM=4 (see 7.5.3), oversampling frequency=2.048 MHz, oversampling ratio=128

temperature range : -40 to 125°C if not otherwise noted

symbol

parameter

conditions

min

typ

max

units

cal_err

calibration error

for 30 000 digits output at

full range

G1, 720 mV

G6, 120 mV

G24, 30 mV

G50, 15 mV

G100, 7.5 mV

0.1

0.2

%

1)

lin_err

nonlinearity

gain 6 @ room temp

0.1

0.3

gain 24 @ room temp

0.03

0.05

gain 50 @ room temp

0.05

0.07

gain 100 @ room temp

0.05

0.1

lin_errTC

TC of linearity error

all gains

1

5

ppm/K

3)

Vos

offset voltage:

RSHH_RSHL

-40 to 125°C

-0.5

0.2

0.5

µV

4)

offset voltage: ETS, ETR,

VBAT

-40 to 85°C

-2

0.5

1

µV

4)

85 to 125°C

-4

1

2

µV

4)

dVos/dT

Offset voltage drift: RSHH-

RSHL

-40 to 85 °C

0.002

µV/K

Ib

input bias/leakage current,

all channels

room temperature

-1

0.2

1

nA

5)

Vndin

voltage noise density

(G=24)

f=0 to 1 kHz

35

50

nV//Hz

6)

Indin

current noise density

(G=24)

f=10 Hz

5

20

100

fA//Hz

6)

en p_p

voltage noise, peak (G=24)

0 to 100 Hz

2

3

5

µV

6)

0 to 10 Hz

0.5

1

1.5

µV

6)

en_RMS

voltage noise, RMS (G=24) 1000 Hz

1.5

2

µV

SNR

signal to noise (G=24,

G4.8)

room temperature

90

100

dBmin

SDR

signal to distortion (G24,

G4.8)

room temperature

80

100

dBmin

CCI

chanel to chanel insulation

room temperature

-70

-90

dBmax

PSRR

power supply rejection ratio 4.9 to 5.1 V

-50

-60

dBmax

Notes:

1)

at room temperature / corresponding calibration factors are stored within the ZZR-register

2

) whatever is lower. Maximum limits for gains 50 and 100 are derived from device characterization and are not tested.

3)

this value measured in raw mode at room temperature and at 60°C. Maximum limits over temperature range are derived from device characterization.

4)

TC variations are included in the above given maximum limit of linearity error. Max value is derived from device characterization and not tested

5)

Leakage current is specified for all gain settings (except G1) for positive input voltages below 200 mV. Test is done at different input voltages with

subsequent extrapolation for 200mV. In the temperature range 85-125°C it may be as high as 5 nA at the upper limit. In normal operation a

temperature independent digital offset of -0.7 digits is present due to internal rounding.

6)

This parameter is not measured directly. It is measured indirectly via gain measurement of the whole path at room temperature