M95512-R datasheet(39/50 Pages) STMICROELECTRONICS

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M95512-W M95512-R M95512-DR M95512-DF

DC and AC parameters

Table 20. AC characteristics (M95512-W products, device grade 6)

Test conditions: refer to Table 8 and Table 11 (1)

Symbol

Alt.

Parameter

Min.

Max.

Min.

Max.

Unit

2.5 V to 5.5 V

4.5 V to 5.5 V

fSCK

Clock frequency

D.C.

MHz

tSLCH

tCSS1

S active setup time

tSHCH

tCSS2

S not active setup time

tSHSL

tCS

S deselect time

tCHSH

tCSH

S active hold time

tCHSL

S not active hold time

tCH (2)

tCLH

Clock high time

tCL(2)

tCLL

Clock low time

tCLCH(3)

tRC

Clock rise time

µs

tCHCL(3)

tFC

Clock fall time

µs

tDVCH

tDSU

Data in setup time

tCHDX

tDH

Data in hold time

tHHCH

Clock low hold time after HOLD not active

tHLCH

Clock low hold time after HOLD active

tCLHL

Clock low setup time before HOLD active

0-0-

tCLHH

Clock low setup time before HOLD not

active

0-0-

tSHQZ(3)

tDIS

Output disable time

tCLQV

Clock low to output valid

tCLQX

tHO

Output hold time

tQLQH(3)

tRO

Output rise time

tQHQL(3)

tFO

Output fall time

tHHQV

tLZ

HOLD high to output valid

tHLQZ(3)

tHZ

HOLD low to output High-Z

tWC

Write time

1. For devices identified by process letter KB.

2. tCH + tCL must never be less than the shortest possible clock period, 1 / fC(max).

3. Characterized only, not tested in production.

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