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A6985F 数据表(PDF) 68 Page - STMicroelectronics |
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A6985F 数据表(HTML) 68 Page - STMicroelectronics |
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68 / 77 page ![]() EMC testing results A6985F 68/77 DocID027738 Rev 2 10 EMC testing results This chapter reports EMC testing results for the A6985F evaluation board (see Section 8 on page 56) accordingly with the following test methods: CE 150R for conducted emission DP for conducted immunity All the measurement were performed on the A6985F5V at ILOAD = 10% and 75% as defined in Table 22. DPI: 30 dBm for global pins, 12 dBm for local pins. All the pins under DPI testing (see Table 22) satisfy class 3 limits. Table 20. CE 150R test method Conducted emission, CE 150R Frequency range 150 kHz - 30 MHz 30 MHz - 1 GHz Bandwidth 9 kHz 120 kHz Step size 5 kHz 60 kHz Dwell time 2 complete software cycles minimum Detectors Peak + average Table 21. DPI test method Conducted Immunity, DPI Frequency range 10 kHz - 150 kHz 150 kHz - 1 MHz 1 MHz - 10 MHz 10 MHz - 100 MHz 100 MHz - 200 MHz 200 MHz - 400 MHz 400 MHz - 1 GHz Step size (linear) 10 kHz 100 kHz 500 kHz 1 MHz 2 MHz 4 MHz 10 MHz Dwell time 2 sec. but min. 2 software complete cycles Modulation CW AM 1 kHz, 80% (same peak value as CW) Table 22. Pin testing Pin name Remarks classification CE DPI VS1 Filtered VIN pin Global X X VIN VIN pin Global X X VOUT Regulated output voltage Local X RST RST pin Local X SS/INH SS/INH pin Local X (X) |
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