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ADS5541IPAPR 数据表(PDF) 6 Page - Texas Instruments

部件名 ADS5541IPAPR
功能描述  14-Bit, 105MSPS Analog-To-Digital Converter
PDF  37 Pages
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制造商  TI1 [Texas Instruments]
网页  http://www.ti.com
标志 TI1 - Texas Instruments

ADS5541IPAPR 数据表(HTML) 6 Page - Texas Instruments

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Input Clock
Analog
Input
Signal
Sample
N
N + 1
N + 2
N + 3
N + 4
N + 1 4
N + 1 6
N + 1 7
N + 1 5
N − 17
N − 16
N − 15
N − 14
N − 13
N − 3
N − 2
N − 1
N
tsu
th
tSTART
tA
tEND
tPDI
Data Out
(D0−D13)
17.5 Clock Cycles
Data Invalid
Output Clock
TIMING CHARACTERISTICS
(1) (2)
Production Data
ADS5541
SBAS307C – MAY 2004 – REVISED FEBRUARY 2007
NOTE: It is recommended that the loading at CLKOUT and all data lines are accurately matched to ensure that the above
timing matches closely with the specified values.
Figure 1. Timing Diagram
At T
A = +25°C, min and max specified over the full temperature range of –40°C to +85°C, sampling rate = 105MSPS, 50%
clock duty cycle, AV
DD = DRVDD = 3.3V, and 3VPP differential clock, unless otherwise noted.
ADS5541
PARAMETER
DESCRIPTION
MIN
TYP
MAX
UNIT
Switching Specification
tA
Aperture delay
Input CLK falling edge to data sampling point
1
ns
Aperture jitter (uncertainty)
Uncertainty in sampling instant
300
fs
tSU
Data setup time
Data valid(3) to 50% of CLKOUT rising edge
2.2
2.8
ns
tH
Data hold time
50% of CLKOUT rising edge to data becoming invalid(3)
2.2
2.5
ns
tSTART(4)(5)
Input clock to output data
Input clock rising edge to data valid start delay
1.9
2.8
ns
valid start
tEND(4)(5)
Input clock to output data
Input clock rising edge to data valid end delay
5.8
7.3
ns
valid end
tJIT
Output clock jitter
Uncertainty in CLKOUT rising edge, peak-to-peak
175
250
ps
tRISE
Output clock rise time
Rise time of CLKOUT from 20% to 80% of DRVDD
2
2.2
ns
tFALL
Output clock fall time
Fall time of CLKOUT from 80% to 20% of DRVDD
1.7
1.8
ns
tPDI
Input clock to output clock
Input clock rising edge, zero crossing, to output clock
4
4.7
5.5
ns
delay
rising edge 50%
tR
Data rise time
Data rise time measured from 20% to 80% of DRVDD
4.4
5.1
ns
tF
Data fall time
Data fall time measured from 80% to 20% of DRVDD
3.3
3.8
ns
Output enable(OE) to data
Time required for outputs to have stable timings with
Clock
1000
output delay
regard to input clock(6) after OE is activated
cycles
Time to valid data after coming out of software power
Clock
Wakeup time
1000
down and stopping and restarting the clock
cycles
Clock
Latency
Time for a sample to propagate to the ADC outputs
17.5
cycles
(1)
Timing parameters are ensured by design and characterization and not tested in production.
(2)
See Table 5 through Table 8 in the Application Information section for timing information at additional sampling frequencies.
(3)
Data valid refers to 2V for LOGIC high and 0.8V for LOGIC low.
(4)
See the Output Information section for details on using the input clock for data capture.
(5)
These specifications apply when the CLKOUT polarity is set to rising edge (according to Table 3). Add 1/2 clock period for the valid
number for a falling edge CLKOUT polarity.
(6)
Data outputs are available within a clock from assertion of OE; however, it takes 1000 clock cycles to ensure stable timing with respect
to input clock.
6
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