STM32F412RG datasheet(115/193 Pages) STMICROELECTRONICS

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STM32F412xE/G

Electrical characteristics

161

Electromagnetic Interference (EMI)

The electromagnetic field emitted by the device are monitored while a simple application,

executing EEMBC code, is running. This emission test is compliant with IEC61967-2

standard which specifies the test board and the pin loading.

6.3.14

Absolute maximum ratings (electrical sensitivity)

Based on three different tests (ESD, LU) using specific measurement methods, the device is

stressed in order to determine its performance in terms of electrical sensitivity.

Electrostatic discharge (ESD)

Electrostatic discharges (a positive then a negative pulse separated by 1 second) are

applied to the pins of each sample according to each pin combination. The sample size

depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test

conforms to the JESD22-A114/C101 standard.

Table 52. EMI characteristics for LQFP144

Symbol

Parameter

Conditions

Monitored

frequency band

Max vs.

[fHSE/fCPU]

Unit

8/100 MHz

SEMI

Peak level

VDD = 3.6 V, TA = 25 °C, LQFP144

package, conforming to IEC 61967-2,

EEMBC, ART ON, all peripheral clocks

enabled, clock dithering disabled.

0.1 to 30 MHz

dBµV

30 to 130 MHz

130 MHz to 1 GHz

EMI Level

3.5

Table 53. ESD absolute maximum ratings

Symbol

Ratings

Conditions

Class

Maximum

value(1)

Unit

VESD(HBM)

Electrostatic

discharge voltage

(human body model)

TA = +25 °C conforming to JESD22-A114

2000

VESD(CDM)

Electrostatic

discharge voltage

(charge device model)

TA = +25 °C conforming to ANSI/ESD STM5.3.1,

UFBGA144, UFBGA100, LQFP100, LQFP64,

UFQFPN48

4500

TA = +25 °C conforming to ANSI/ESD STM5.3.1,

WLCSP64

3400

TA = +25 °C conforming to ANSI/ESD STM5.3.1,

LQFP144

3250

1. Guaranteed by characterization, not tested in production.

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