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AM29F032B 数据表(PDF) 25 Page - Advanced Micro Devices |
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AM29F032B 数据表(HTML) 25 Page - Advanced Micro Devices |
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25 / 39 page ![]() 24 Am29F032B TEST CONDITIONS Table 7. Test Specifications KEY TO SWITCHING WAVEFORMS 2.7 k Ω CL 6.2 k Ω 5.0 V Device Under Test Figure 8. Test Setup Note: Diodes are IN3064 or equivalent Test Condition -75 All others Unit Output Load 1 TTL gate Output Load Capacitance, C L (including jig capacitance) 30 100 pF Input Rise and Fall Times 5 20 ns Input Pulse Levels 0.0–3.0 0.45–2.4 V Input timing measurement reference levels 1.5 0.8 V Output timing measurement reference levels 1.5 2.0 V WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) |
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