STM32F411RET6 datasheet(61/149 Pages) STMICROELECTRONICS

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STM32F411xC STM32F411xE

Electrical characteristics

123

Table 12. Current characteristics

Symbol

Ratings

Max.

Unit

ΣIVDD

Total current into sum of all VDD_x power lines (source)(1)

160

Σ IVSS

Total current out of sum of all VSS_x ground lines (sink)(1)

-160

IVDD

Maximum current into each VDD_x power line (source)(1)

100

IVSS

Maximum current out of each VSS_x ground line (sink)(1)

-100

IIO

Output current sunk by any I/O and control pin

Output current sourced by any I/O and control pin

-25

ΣIIO

Total output current sunk by sum of all I/O and control pins (2)

120

Total output current sourced by sum of all I/Os and control pins(2)

-120

IINJ(PIN) (3)

Injected current on FT and TC pins (4)

–5/+0

Injected current on NRST and B pins (4)

ΣIINJ(PIN)

Total injected current (sum of all I/O and control pins)(5)

±25

1. All main power (VDD, VDDA) and ground (VSS, VSSA) pins must always be connected to the external power supply, in the

permitted range.

2. This current consumption must be correctly distributed over all I/Os and control pins.

3. Negative injection disturbs the analog performance of the device. See note in Section 6.3.20: 12-bit ADC characteristics.

4. Positive injection is not possible on these I/Os and does not occur for input voltages lower than the specified maximum

value.

5. When several inputs are submitted to a current injection, the maximum

ΣIINJ(PIN) is the absolute sum of the positive and

negative injected currents (instantaneous values).

Table 13. Thermal characteristics

Symbol

Ratings

Value

Unit

TSTG

Storage temperature range

–65 to +150

°C

Maximum junction temperature

130

TLEAD

Maximum lead temperature during soldering

(WLCSP49, LQFP64/100, UFQFPN48,

UFBGA100)

see note (1)

1. Compliant with JEDEC Std J-STD-020D (for small body, Sn-Pb or Pb assembly), the ST ECOPACK®

7191395 specification, and the European directive on Restrictions on Hazardous Substances (ROHS

directive 2011/65/EU, July 2011).

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