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STM32F411RET6 数据表(PDF) 96 Page - STMicroelectronics

部件名 STM32F411RET6
功能描述  ARM® Cortex®-M4 32b MCUFPU, 125 DMIPS, 512KB Flash, 128KB RAM, USB OTG FS, 11 TIMs, 1 ADC, 13 comm. interfaces
PDF  149 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

STM32F411RET6 数据表(HTML) 96 Page - STMicroelectronics

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Electrical characteristics
STM32F411xC STM32F411xE
96/149
DocID026289 Rev 6
Static latchup
Two complementary static tests are required on six parts to assess the latchup
performance:
A supply overvoltage is applied to each power supply pin
A current injection is applied to each input, output and configurable I/O pin
These tests are compliant with EIA/JESD 78A IC latchup standard.
6.3.15
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below VSS or
above VDD (for standard, 3 V-capable I/O pins) should be avoided during normal product
operation. However, in order to give an indication of the robustness of the microcontroller in
cases when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibility to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (>5
LSB TUE), out of conventional limits of induced leakage current on adjacent pins
(out of –5 µA/+0 µA range), or other functional failure (for example reset, oscillator
frequency deviation).
Negative induced leakage current is caused by negative injection and positive induced
leakage current by positive injection.
The test results are given in Table 52.
Table 51. Electrical sensitivities
Symbol
Parameter
Conditions
Class
LU
Static latch-up class
TA = + 125 °C conforming to JESD78A
II level A
Table 52. I/O current injection susceptibility(1)
Symbol
Description
Functional susceptibility
Unit
Negative
injection
Positive
injection
IINJ
Injected current on BOOT0 pin
–0
NA
mA
Injected current on NRST pin
–0
NA
Injected current on PB3, PB4, PB5, PB6, PB7,
PB8, PB9, PC13, PC14, PC15, PH1, PDR_ON,
PC0, PC1,PC2, PC3, PD1, PD5, PD6, PD7, PE0,
PE2, PE3, PE4, PE5, PE6
–0
NA
Injected current on any other FT pin
–5
NA
Injected current on any other pins
–5
+5
1. NA = not applicable
.



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