M95010-R datasheet(38/46 Pages) STMICROELECTRONICS

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DC and AC parameters

M950x0-W M950x0-R M950x0-DF

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Table 21. AC characteristics (M950x0-R, device grade 6) (1)

1. Not recommended for new designs, for new designs refer to Table 19: AC characteristics (M950x0-R or

M95040-DF, device grade 6)

Test conditions specified in Table 10 and Table 12 (2)

2. The test flow guarantees the AC parameter values defined in this table (when VCC = 1.8 V) and the AC

parameter values defined in Table 20: AC characteristics (M950x0-W, device grade 6) (when VCC = 2.5 or

when VCC = 5.0 V).

Symbol

Alt.

Parameter

Min.

Max.

Unit

fSCK

Clock frequency

D.C.

MHz

tSLCH

tCSS1

S active setup time

tSHCH

tCSS2

S not active setup time

tSHSL

tCS

S deselect time

100

tCHSH

tCSH

S active hold time

tCHSL

-S not active hold time

tCH(3)

3. tCH + tCL must never be less than the shortest possible clock period, 1 / fC(max)

tCLH

Clock high time

tCL(2)

tCLL

Clock low time

tCLCH(4)

4. Value guaranteed by characterization, not 100% tested in production.

tRC

Clock rise time

µs

tCHCL(3)

tFC

Clock fall time

µs

tDVCH

tDSU

Data in setup time

tCHDX

tDH

Data in hold time

tHHCH

Clock low hold time after HOLD not active

tHLCH

Clock low hold time after HOLD active

tCLHL

Clock low setup time before HOLD active

tCLHH

Clock low setup time before HOLD not active

tSHQZ(3)

tDIS

Output disable time

100

tCLQV

Clock low to output valid

tCLQX

tHO

Output hold time

tQLQH(3)

tRO

Output rise time

tQHQL(3)

tFO

Output fall time

tHHQV

tLZ

HOLD high to output valid

tHLQZ(3)

tHZ

HOLD low to output high-Z

100

tWC

Write time

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