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Individual write commands are used together in eight program and erase algorithms to guarantee the AS29F010 operating margins for the

life of the part. Refer to the AS29F010 Programming Specification for details on the algorithms for program and erase operation .

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Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation

of the device at these or any other conditions outside those indicated in the operational sections of this specification is notimplied. Exposure to absolute max-

imum rating conditions for extended periods may affect reliability.

Mode

address

data

Read address

Read data

Read delay

Maximum time out

Reset

00h

x

x

0000h

Status

100 ns

250 µs

Status

01h

x

x

0000h

Status

100 ns

250 µs

ID Read

code

02h

0000h

0001h

x

x

0000h

0001h

Mfr. code

52h

Device code

04h

100 ns

100 ns

250 µs

Verify-0

04h

25 µs

250 µs

Verify-1

08h

25 µs

250 µs

Converge

10h

00h

Status

100 ns

250 µs

Program

40h

Status

100 ns

250 µs

Erase

80h

FFh

Status

100 ns

1000 µs

Parameter

Symbol

Min

Typ

Max

Unit

Supply voltage

4.5

5.0

5.5

V

00

0V

Input voltage

2.0

-

V

–0.5

-

0.8

V

Parameter

Symbol

Min

Max

Unit

Input voltage (Input or DQ pin)

–1.0

V

Input voltage (A9 pin)

–1.0

+13.0

V

Output voltage

–1.0

V

Power supply voltage

+4.5

+5.5

V

Operating temperature

–55

+125

°C

Storage temperature (plastic)

–65

+125

°C

Short circuit output current

-100

mA

Latch-up current

-±100

mA