AS29F010 datasheet(5/10 Pages) ALSC

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Not more than one output tested simultaneously. Duration of the short circuit must not be >1 second. OUT = 0.5V was selected to avoid test problems

caused by tester ground degradation. (This parameter is sampled and not 100% tested, but guaranteed by characterization.)

2The ICC current listed includes both the DC operating current and the frequency dependent component (@ 6 MHz). The frequency componenttypically

is less than 2 mA/MHz with OE at VIH.

3ICC active while program or erase operations are in progress.

Parameter

Symbol

Test conditions

Min

Max

Unit

Input load current

ILI

VIN = VSS to VCC, VSS = VMAX

-±1

µA

Output leakage current

ILO

VOUT = VSS to VCC, VSS = VMAX

-±1

µA

Output short circuit current

IOS

VOUT = 0.5V

100

Active current, read @ 6MHz

ICC

CE = VIL, OE = VIH

-30

Active current, program/erase

ICCPRG

CE = VIL, OE = VIH

-50

Standby current

ISB1 (TTL)

CE = VIH

-1.5

ISB2 (CMOS) CE = VCC

-1.0

ICCPD

RP = 0V

µA

Input: low level

VIL

0.5

0.8

Input: high level

VIH

2.0

VSS + 0.3

Output low voltage

VOL

IOL = 12mA

0.45

Output high level

VOH1

IOH = -2.5 mA

2.4

VOH2

IOH = -100 µA

VCC - 0.4

Low VCC lock out voltage

VLKO

3.2

4.2

Input HV select voltage

VID

11.5

12.5

-2.0V

-0.5V

+0.8V

VCC+2.0V

VCC+0.5V

+2.0V

AS29F010 数据表(PDF) 5 Page - Alliance Semiconductor Corporation

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