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ADPA7008CHIP 数据表(PDF) 22 Page - Analog Devices |
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ADPA7008CHIP 数据表(HTML) 22 Page - Analog Devices |
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22 / 26 page ![]() ADPA7008CHIP Data Sheet Rev. 0 | Page 22 of 26 HMC980LP4E BIAS SEQUENCE The dc supply sequence described in this section is required to prevent damage to the HMC980LP4E when using the device to control the ADPA7008CHIP. Power-Up Sequence The power-up sequence for the HMC980LP4E is as follows: 1. Set VDIG = 3.3 V 2. Set S0 = 3.3 V 3. Set VDD = 5.72 V. 4. Set VNEG = −1.5 V (this step is unnecessary if using internally generated voltage) 5. Set EN = 3.3 V (the transition from 0 V to 3.3 V turns on VGATE and VDRAIN). Power-Down Sequence The power-down sequence for the HMC980LP4E is as follows: 1. Set EN = 0 V (the transition from 3.3 V to 0 V turns off VDRAIN and VGATE). 2. Set VNEG = 0 V (this step is unnecessary if using internally generated voltage) 3. Set VDD = 0 V. 4. Set S0 = 0 V 5. Set VDIG = 0 V After the HMC980LP4E bias control circuit is set up, toggle the bias to the ADPA7008CHIP on or off by applying 3.3 V or 0 V, respectively, to the EN pad. At EN = +3.3 V, VGATE drops to −1.5 V, and VDRAIN turns on at +5 V. VGATE then rises until IDRAIN = 1700 mA, and the closed control loop regulates IDRAIN at 1600 mA. When EN = 0 V, VGATE is set to −1.5 V, and VDRAIN is set to 0 V. CONSTANT DRAIN CURRENT BIASING vs. CONSTANT GATE VOLTAGE BIASING The HMC980LP4E uses closed-loop feedback to continuously adjust VGATE to maintain a constant drain current bias over dc supply variation, temperature, and device to device variation. In addition, constant drain current bias is the optimum method for reducing time in calibration procedures and for maintaining consistent performance over time. By comparing the constant drain current bias with a constant gate voltage bias where the current is driven to increase when RF power is applied, a slightly lower output P1dB is seen with a constant drain current bias. This output P1dB is shown in Figure 61 and Figure 63, where the RF performance is slightly lower than the constant gate voltage bias operation due to a lower drain current at the high input powers as the device reaches 1 dB compression. To increase the output P1dB performance for the constant drain current bias toward the constant gate voltage bias performance, increase the set current toward the IDD value this performance reaches under the RF drive in the constant gate voltage bias condition, as shown in Figure 61 and Figure 63. The limit of increasing IDQ under the constant drain current operation is set by the thermal limitations found in Table 5 with the maximum power dissipation specification. As IDD increase continues, the actual output P1dB does not continue to increase indefinitely, and the power dissipation increases. Therefore, when using constant drain current biasing, take the trade-off between the power dissipation and the output P1dB performance. |
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