ADGM1304JCPZ-R2 datasheet(30/34 Pages) AD

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ADGM1304

Data Sheet

Rev. G | Page 30 of 34

CRITICAL OPERATIONAL REQUIREMENTS

SYSTEM ERROR CONSIDERATIONS DUE TO

ON-RESISTANCE DRIFT

The RON performance of the ADGM1304 is affected by device

to device variation, channel to channel variation, cycle

actuations, settling time post turn on, bias voltage, and

temperature changes (see Figure 6 to Figure 12 and Figure 59).

In a 50 Ω system, the on-resistance drift over switch actuations

(∆RON) can introduce system inaccuracy. Figure 58 shows the

ADGM1304 connected with the load in a 50 Ω system, where

RS is the source impedance. To calculate the system error

caused by the ADGM1304 on-resistance drift, use the following

equation:

System Error (%) = ΔR/RLOAD

where:

ΔR is the ADGM1304 on-resistance drift.

RLOAD is the load impedance.

The ADGM1304 on-resistance drift also affects insertion loss,

which must be considered when using the device. To calculate

the on-resistance impact on insertion loss, use the following

equation:

Insertion Loss = 10log(1 + (ΔR/RLOAD))

50Ω

ΔR

RLOAD

50Ω

Figure 58. 50 Ω System Representation Where the ADGM1304 Is Connected

with the Load

Table 8. System Error and Insertion Loss Error Due to

ADGM1304 RON Drift

On-Resistance Drift

System

Error (%)

Insertion Loss Error (dB)

4.75

9.5

0.39

0.41

The on-resistance drift over time specification is −0.25 Ω

measured after 100 ms, as shown in Figure 8 to Figure 10.

According to the plots, the on-resistance drift over time is

−0.12 Ω after 100 ms. The on resistance of the ADGM1304

typically drifts by −0.05 Ω per decade. For example, after

100 ms, the on resistance drifts −0.12 Ω. After 1 sec, the on

resistance drifts −0.17 Ω, and after 10 sec, it drifts −0.22 Ω.

Therefore, after 1000 sec, the on resistance is expected to drift

by −0.32 Ω.

ON-RESISTANCE SHIFT DUE TO TEMPERATURE

SHOCK POST ACTUATIONS

When the switch is actuated multiples times at one temperature,

and if there is a sudden shift in this temperature, a large shift is

shown in the switch RON. Figure 59 shows the absolute RON

performance of the population of devices over actuation

lifetime. Figure 59 shows how the absolute RON of the device

drifts over actuation lifetime. During this measurement, the

switch is actuated at 85°C and the switch RON is measured at

25°C. Actuating the switch at 85°C and measuring RON at 25°C

is the most severe condition for the ADGM1304 RON drift over

actuations.

100

ASOLUTE RON (Ω)

1 ACTUATION

167 MILLION ACTUATIONS

500 MILLION ACTUATIONS

1 BILLION ACTUATIONS

SWITCH ACTUATED AT 85°C

RON MEASURED AT 25°C

VDD = 3.3V

Figure 59. Population vs. Absolute RON, Switch Actuated at 85°C and RON

Measured at 25°C

HOT SWITCHING

Hot switching is caused by cycling the switch on or off with a

signal applied to the switch. The presence of the applied signal

during switching cycle damages the switch contacts. Hot

switching damage is dependent on the current or the voltage

levels. Hot switching causes a significant reduction in the cycle

lifetime of the switch as shown in Table 1 and Figure 13.

Figure 60 shows the hot switching condition when the switch is

turned on with a 1 V signal present at the switch terminal

during switching.

GATE

RF1

RFC

SWITCH IS OFF

GATE

RF1

RFC

SWITCHING FROM OFF TO ON

NOTES

1. THE PRESENCE OF THE APPLIED SIGNAL DURING

SWITCHING CYCLE DAMAGES THE SWITCH CONTACTS.

DAMAGE AREA

SEE NOTE 1.

Figure 60. Hot Switching Condition When Turning the Switch from Off to On State

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