ADGM1304JCPZ-R2 datasheet(32/34 Pages) AD

32 / 34 page

ADGM1304

Data Sheet

Rev. G | Page 32 of 34

CUMULATIVE ON SWITCH LIFETIME

Leaving the switch in an on state for a long period affects the

lifetime of the switch because of mechanical degradation

effects. These effects can result in the switch failing to turn off.

Figure 69 shows a failure rate at 50°C where the mean time to

failure is 7.2 years (2628 days), resulting in 50% of the sample

lot failing at this point.

100

1,000

CONTINUOUSLY ON TIME (DAYS)

10,000

100,000

VDD = 3.3V

Figure 69. Cumulative On Switch Lifetime at 50°C, VDD = 3.3 V,

Sample Size = 31 Devices

Temperatures above 50°C further reduce the switch lifetime.

The cumulative on switch lifetime specification is also duty cycle

dependent. If the user operates the MEMS switch with a duty

cycle of less than 50%, the lifetime of the MEMS switch improves.

HANDLING PRECAUTIONS

ESD Precautions

All RFx pins of the ADGM1304 pass the following ESD limits:

•

100 V, Class 0 HBM, ANSI/ESDA/JEDEC JS-001-2010

•

500 V, Class C2 FICDM, JEDEC JESD22_C101E

All the RFx pins are rated to 500 V FICDM, making the device

safe for automated handling and assembly process. Standard

ESD precautions should be taken during manufacturing.

100 V HBM rating of ADGM1304 is susceptible to ESD surge

due to human body contact. ESD protection should be added if

human body contact is expected.

Electrical Overstress (EOS) Precautions

The ADGM1304 is susceptible to EOS. Therefore, take the

following precautions:

•

The ADGM1304 is an ESD sensitive device. Ensure to take

all normal handling precautions, including working only

on static dissipative surfaces, wearing wrist straps or other

ESD control devices, and storing unused devices in

conductive foam.

•

Avoid running measurement instruments, such as digital

multimeters (DMMs), in autorange modes. Some

instruments generate large transient compliance voltages

when switching between ranges.

•

Use the highest practical DMM range setting (the lowest

resolution) for resistance measurements to minimize

compliance voltages, particularly during switching.

•

Discharge coaxial cables before connecting directly to the

switch. Note that coaxial cables can store charge and lead

to EOS when directly connected to the switch.

•

Avoid connecting large capacitive terminations directly to

the switch, as shown in Figure 70. A shunt capacitor can

store a charge that potentially leads to hot switching events

when the switch opens or closes, affecting the lifetime of

the switch.

RFx

RFC

Figure 70. Avoid Having a Large Capacitor Directly Connected to the

MEMS Switch

Mechanical Shock Precautions

The ADGM1304 passes Group D mechanical shocks tests, as

detailed in Table 3 in the Absolute Maximum Ratings section.

These tests validate the robustness of the device to typical

mechanical shocks.

Do not use the device if dropped. To reduce excessive

mechanical shock and ESD events, avoid handling of loose

devices, as shown in Figure 71.

NOT RECOMMENDED

DEVICES STORED BULK

IN BINS

DEVICE DROPPED

DEVICES DUMPED OUT

ON BENCHTOP

Figure 71. Situations to Avoid During Handling

ADGM1304JCPZ-R2 数据表(PDF) 32 Page - Analog Devices

ADGM1304JCPZ-R2 数据表(HTML) 32 Page - Analog Devices

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34

数据表下载