AD5378ABC datasheet(27/28 Pages) AD

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Preliminary Technical Data

AD5378

Rev. PrA | Page 27 of 28

TYPICAL APPLICATION CIRCUIT

The high channel count of the AD5378 makes it wellsuited to

applications requiring high levels of integration such as optical

and automatic test equipment (ATE) systems. Figure 22 shows

the AD5378 as it is used in an ATE system. Shown here is one

pin of a typical logic tester. It is apparent that a number of

discrete levels are required for the pin driver, active load circuit,

parametric measurement unit, comparators, and clamps.

In addition to the DAC levels required in the ATE system

shown, drivers, loads, comparators, and parametric

measurement unit functions are also required. Analog Devices

provides solutions for all these functions.

DAC

CENTRAL PMU

DRIVEN SHIELD

VCH

VTH

VTL

IOL

VCOM

IOH

VCL

DRIVER

COMP

ACTIVE LOAD

FORMATTER DE-SKEW

COMPARE

MEMORY

TIMING DATA

MEMORY

TIMING

GENERATOR

DLL LOGIC

FORMATTER DE-SKEW

VTERM

PPMU

RELAYS

GND SENSE

DEVICE POWER

SUPPLY

Ω COAX

DUT

GUARD AMP

DAC

ADC

DAC

ADC

DAC

ADC

Figure 22. Typical Application Circuit for Logic Tester

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